ELECTRONIC STRUCTURE OF FeSi
V.R.Galakhov, E.Z.Kurmaev, V.M.Cherkashenko, Yu.M.Yarmoshenko, S.N.Shamin, A.V.Postnikov, St.Uhlenbrock, M.Neumann, Z.W.Lu, Barry M.Klein, Zhu-Pei Shi
Abstract
The full set of high-energy spectroscopy measurements including X-ray photoelectron valence band spectra and soft X-ray emission valence band spectra of both components of FeSi (Fe K_beta_5, Fe L_alpha, Si K_beta_1,3 and Si L_2,3) are performed and compared with the results of ab-initio band structure calculations using the linearized muffin-tin orbital method and linearized augmented plane wave method.