Resonant Inelastic X-Ray Scattering (RIXS) in SrCuO 2
Atsushi Higashiya, Akihiko Shigemoto, Shuuichi Kasai, Shin Imada, Shigemasa Suga, Michael Sing, Changyoung Kim, Makina Yabashi, Kenji Tamasaku, Tetsuya Ishikawa
Abstract
The resonant inelastic x-ray scattering (RIXS) was measured in an insulating SrCuO
2
with changing the incident photon energy (
hν
) near the Cu
1s
absorption edge (K-edge). Complex structures and their dependences on the momentum transfer(
Δk
) and
hν
were observed. The
hν
dependence of the RIXS spectra measured for a constant
Δk
=2.4
π
has shown a remarkable enhancement near the absorption maximum and a shift of the spectral weight toward larger loss-energy with increasing
hν
. Also, the energy of the inelastic loss peak in the RIXS spectra for the fixed excitation at 8.993 keV, 10 eV below the absorption maximum, has shown a clear dependence on
Δk
. These results are in a qualitative agreement with a theoretical prediction. Full utilization of the potential of the high brilliance X ray light source at BL19LXU of SPring-8 with 27 m long insertion device will open up a breakthrough in RIXS for heavy transition metal compounds in accordance with the improvement in focussing and analyzing elements.