Theory of groove-envelope phase effects in self-diffraction
TTheory of groove-envelope phase effects in self-diffraction
Jan Reislöhner, Christoph G. Leithold and Adrian N. Pfeiffer
Institute of Optics and Quantum Electronics, Abbe Center of Photonics,Friedrich Schiller University, Max-Wien-Platz 1, 07743 Jena, Germany
If two laser beams cross in a medium under shallow angle, the laser-induced grating consists of onlya few grooves. In this situation, the phase between the grooves of the grating and its envelope is adecisive parameter for nonlinear effects. Here, models are established for reproducing the groove-envelope phase effects that have been observed in the interference pattern of self-diffraction. Four-wave mixing leads to interferences that are dominant in the spatial region between the orders ofdiffraction and with tilted interference fringes in the diagram of transverse coordinate vs. pulse delay.The vertical interference fringes that are dominant directly on the diffraction orders, experimentallyobserved at high intensity close to the damage threshold, require a model beyond four-wave mixing.A model is suggested that is based on optical transmission changes with confinement to regions inthe medium that are smaller than the groove spacing.
I. INTRODUCTION
Strong laser fields in transparent solids change the refractive index. Many of the related phenom-ena can be described by the optical Kerr effect [24], which is based on the third-order nonlinearresponse of the medium [2]. Since recently, there is a rapidly growing interest in situations wheretransparent solids are exposed to very intense few-cycle laser pulses, close to the damage thresholdof the material. An important motivation is that high-order harmonic generation has been realized intransparent solids (see for example [4, 11, 12, 22, 28]). The up-conversion of laser pulses to high-harmonic frequencies gains new opportunities because of the high density as compared to gas-phasetargets. Another motivation stems from the potential of spectroscopic methods that are applicableto wide-bandgap dielectrics [8, 23, 25], giving new insight into the ultrafast dynamics of correlatedmany-electron systems. Furthermore, there is even the prospect of finding new schemes for ultrafastoptoelectronics [21].For the accurate interpretation of spectroscopic methods as well as for the efficient exploitation ofhigh-order harmonic generation from solid targets, effects of pulse propagation in macroscopic me-dia under conditions of extreme nonlinearity need to be understood. Not only simple configurationswith single beams are of interest, but also multi-beam configurations and beams with spatial-temporalcoupling are relevant. Applications include the use of wavefront-rotation, which can be used for isolat-ing attosecond pulses and for ultrafast spectroscopy [18]. Governed by similar principles, two pulses inclose-to-collinear configuration can be used for gating of the high-order harmonic generation [6, 7, 10].The regime of close-to-collinear configurations is barely explored, but it holds a number of interestingphenomena and opportunities. At the intersection of the beams, a close-to-collinear configurationcauses an intensity grating that consists of only a few grooves. The groove-envelope offset phase(GEP), defined as the phase between the grooves and the spatial envelope of the beams, can betuned by varying the delay between the pulses, where a delay of one optical cycle translates into aGEP shift of 2 π . For close-to-collinear configurations, phenomena of nonlinear optics, such as proberetardation [14, 20] or self-diffraction [13], yield sub-cycle dependent signals with imprints of ultrafaststrong-field processes.In a non-collinear beam configuration, the two beams can be diffracted on the grating they form ifthe medium response is nonlinear, a process termed self-diffraction [3, 29]. The self-diffraction orderscan be used for pulse characterization [27] as well as for spectroscopy of the medium itself [17].Recently, it has been demonstrated that self-diffraction can be subcycle dependent (or equivalentlyGEP dependent) in a close-to-collinear configuration [13]. Characteristic interference pattern havebeen observed. The first kind of interference pattern is dominant in the region between the diffractionorders and shows tilted interference fringes in the diagram of transverse coordinate x vs. pulse delay τ . The second kind of interference pattern, observed only at high intensities close to the damage a r X i v : . [ phy s i c s . op ti c s ] A ug threshold, is dominant on the diffraction orders and shows vertical interference fringes.As will be shown in this paper, the first kind of interference pattern can be regarded as a spatialanalogue to the signal of an f -2 f interferometer that depends on the carrier-envelope offset phase(CEP) for few-cycle pulses [1, 19, 26]. The CEP is a decisive parameter for nonlinear processes in thefew-cycle regime [5, 15, 16], and likewise the GEP is a decisive parameter for nonlinear processesin the few-groove regime. The interferences are observed in the spectral overlap between a funda-mental in a frequency-doubled pulse, and likewise the first kind of interference pattern is observed inthe spatial overlap between spatial harmonics (diffraction orders) of the beams. In this respect, theobservation of the second kind of interference pattern was very surprising, because the correspond-ing situation for an f -2 f interferometer would be that the spectrum becomes CEP dependent directlyon the fundamental and the frequency-doubled wavelengths.The aim of this paper is to give a detailed treatment of analytical models describing the interfer-ences in between and on the self-diffraction orders and to distinguish their contributions. Four-wavemixing (FWM), covered in section III, yields an interference pattern of the first kind. Evenly-spaced fil-amentation (ESF), covered in section IV, also yields an interference pattern of the first kind. Localizedtransmission changes (LTC), covered in section V, is the only mechanism studied here that yields aninterference pattern of the second kind. Unlike most treatments, all the dependencies on the phases,both CEP and GEP, are explicitly taken into account. II. DEFINITION OF THE LASER INDUCED GRATING
Laser pulses A and B with electric fields E A ( t, x ) = F A cos( ω t − k x + ϕ CEP ) E B ( t, x ) = F B cos( ω ( t − τ ) + k x + ϕ CEP ) (1)interact in a nonlinear medium at z = 0 with variable pulse delay τ (see Figure 1). The CEP ϕ CEP determines the temporal position of the carrier wave underneath the temporal envelope. In theexperiment reported in Ref. [13], the CEP is not stabilized from shot-to-shot, but is identical for A andB in each shot (interferometric stability). The GEP ϕ GEP , defined by ϕ GEP = ω τ, (2)is adjusted by the pulse delay τ . The GEP is the phase between the grooves of the intensity grating,which forms at z = 0 (see equation (25)), and the spatial envelope of the beams.The pulse envelopes F A = A F ( t, x ) F B = B F ( t − τ, x ) (3)are Gaussian functions in both temporal and spatial dimensions defined by F ( t, x ) = e − σ t e − κ x . (4) A and B are the amplitudes; σ and κ determine the pulse duration and the focal spot size,respectively.It should be noted that within this definition of the fields, their propagation direction depends on thewavelength, but in a usual experimental configuration all wavelength components of a pulse propagateinto the same direction. It has been checked for all calculations presented in this paper that thisapproximation does not cause any significant deviation from a numerical calculation where all thewavelength components propagate into the same direction. The analytical form of the laser gratingused here greatly simplifies the following analytical calculations. ~ cos( w ( t + τ ) - k x )) ~ cos( w t-k x ) ~ cos( w ( t- τ )+ k x ) ~ cos( w ( t- τ )+3 k x )) θθθ E A = F A cos( w t-k x ) E B = F B cos( w ( t- τ )+ k x ) Thin medium L Camera l zx
Figure 1: Laser pulses A and B interact in a nonlinear medium with variable pulse delay τ . The thin mediumhas an infinitesimal thickness l . The light is detected after the macroscopic distance L by a camera, which ispositioned in x − direction such that the first diffraction order next to laser pulse A and the edge of laser pulseA are detected. The main part of laser pulse A is blocked in the experiment [13], because its intensity is muchhigher then the diffraction intensity. III. FOUR-WAVE MIXINGA. Nonlinear response
In case of third-order nonlinearity and instantaneous response, the nonlinear polarization responseof the medium is (atomic units are used throughout the paper unless otherwise stated) P NL ( t, x ) = χ (3) ( E A ( t, x ) + E B ( t, x )) = χ (3) ( 3 F + 6 F A F ω t − k x + ϕ CEP )+ 3 F + 6 F F B ω t + k x − ϕ GEP + ϕ CEP )+ 3 F F B ω t − k x + ϕ GEP + ϕ CEP )+ 3 F A F ω t + 3 k x − ϕ GEP + ϕ CEP )+ F ω t − k x + 3 ϕ CEP )+ F ω t + 3 k x − ϕ GEP + 3 ϕ CEP )+ 3 F F B ω t − k x − ϕ GEP + 3 ϕ CEP )+ 3 F A F ω t + k x − ϕ GEP + 3 ϕ CEP )) . (5)All terms oscillating at angular frequency ω include the phase ϕ CEP , whereas all terms oscillat-ing at angular frequency ω include the phase ϕ CEP . If interference occurs between light at thefundamental frequency and light at the third harmonic frequency, then the detected intensity will bedependent on the CEP. However, interference between the fundamental and the third harmonic wouldrequire an extremely large bandwidth. In case of a second-order nonlinearity in the medium, the in-terference between the fundamental and the second harmonic depends on the CEP likewise, and therequired spectral bandwidth is reduced. This effect is exploited in a so-called f -2 f interferometer todetect CEP drifts [1, 19, 26].In the following, the terms oscillating at angular frequency ω are neglected, because light at thethird harmonic frequency is absorbed in the medium used in Ref. [13]. All terms oscillating at angularfrequency ω include the phase ϕ CEP , as laser pulses A and B do, so the intensity that is detectedafter the medium does not depend on the CEP. Therefore, to simplify the following equations, the CEPdependence is not explicitly included in the following analysis by setting ϕ CEP = 0 . (6)The detection with a camera is restricted to the spatial region of laser pulse A and the neighboringdiffraction order (see Figure 1). For the laser parameters of the analyzed experiment [13], only theterms with phase dependencies − k x and − k x need to be accounted for, whereas the terms withphase dependencies k x and k x can be neglected. For experimental conditions with significantlysmaller crossing angles between A and B or smaller focal waists, all terms could potentially influencethe spatial region between laser pulse A and the neighboring diffraction order. This would lead tointerferences that are GEP-dependent with phases ϕ GEP and ϕ GEP , see [20]. In the experimentdescribed in the Ref. [13], all observed interferences dependent on the GEP with phase ϕ GEP ; fasteroscillations are not observed. Therefore, the effective nonlinear polarization response for the followinganalysis is P EF ( t, x ) = χ (3) ( P AAA ( t, x ) + P ABB ( t, x ) + P AAB ( t, x )) (7)with the definitions P AAA ( t, x ) = 3 F ω t − k x ) P ABB ( t, x ) = 3 F A F ω t − k x ) P AAB ( t, x ) = 3 F F B ω t − k x + ϕ GEP ) . (8)The term P AAA ( t, x ) is associated with self-phase modulation; the term P ABB ( t, x ) is associatedwith cross-phase modulation; the term P AAB ( t, x ) is associated with self-diffraction. The fact thatthe light from self-diffraction depends on the GEP, whereas the light from cross-phase modulationand self-phase modulation as well as pulse A do not depend on the GEP, leads to GEP-dependentinterference (interference that depends on the pulse delay on a subcycle timescale). This can beregarded as the spatial analogue to an f -2 f interferometer: the CEP determines the interference withlight at up-converted temporal frequencies, while the GEP determines the interference with light atup-converted spatial frequencies. B. Pulse propagation
For subsequent pulse propagation, the fields are Fourier transformed with the convention ˜ f ( ω, x ) ∝ (cid:90) + ∞−∞ f ( t, x ) e − iωt dt ˆ f ( ω, k ) ∝ (cid:90) + ∞−∞ ˜ f ( ω, x ) e − ikx dx. (9)The Fourier transform of laser pulse A is ˆ E A ( ω, k ) ∝ A e − σ ( ω − ω ) e − κ ( k + k ) . (10)Similarly, the Fourier transform of the effective nonlinear polarization response is obtained: ˆ P AAA ( ω, k ) ∝ A e − σ ( ω − ω ) e − κ ( k + k ) ˆ P ABB ( ω, k ) ∝ A B e − σ ( ω − ω ) e − i τ ( ω − ω ) e − κ ( k + k ) e − σ τ ˆ P AAB ( ω, k ) ∝ A B e − σ ( ω − ω ) e − i τ ( ω − ω ) e − κ ( k +3 k ) e − σ τ e iω τ . (11)In the limit of a thin medium with infinitesimal thickness l , the electric field after the medium is ˆ E FWM ( ω, k ) = ˆ E A ( ω, k ) + ˆ E B ( ω, k ) − i πωlc ˆ P NL ( ω, k ) , (12)where c is the speed of light. The linear polarization response is neglected here for simplicity, butit can be shown that the linear polarization response does not yield any additional interferences inself-diffraction.Restriction to the spatial region of laser pulse A and the neighboring diffraction order and restrictionto the frequency ω = ω yields ˆ E FWM ( ω = ω , k ) ∝ A e − κ ( k + k ) + C e − κ ( k + k ) + D e − κ ( k +3 k ) e iω τ (13)with the definitions C = − i πω lc χ (3) (cid:18) A + 12 A B e − σ τ (cid:19) D = − i πω lc χ (3) (cid:18) A B e − σ τ (cid:19) . (14)After the interaction with the thin nonlinear medium, the electric field propagates the macroscopicdistance L through free space to a camera. With the definition β = 12 cω L (15)and within the paraxial approximation, the electric field at distance L is given by ˆ E FWM L ( ω = ω , k ) ∝ ˆ E FWM ( ω = ω , k ) e iβk = (cid:16) A e − κ ( k + k ) + C e − κ ( k + k ) + D e − κ ( k +3 k ) e iω τ (cid:17) e iβk . (16)The inverse Fourier transform can be performed yielding a representation in space-domain: ˜ E FWM L ( ω = ω , x ) ∝ A L e λ A e iφ A + C L e λ C e iφ C + D L e λ D e iφ D (17)with the definitions λ A = −
11 + β ( κ/ (cid:18) κ ( x − k β ) − k β κ (cid:19) φ A = −
11 + β ( κ/ (cid:18) βκ x + k x (cid:19) λ C = −
11 + β ( κ/ (cid:18) κ ( x − k β ) − k β κ (cid:19) φ C = −
11 + β ( κ/ (cid:18) βκ x + k x (cid:19) λ D = −
11 + β ( κ/ (cid:18) κ ( x − k β ) − k ) β κ (cid:19) φ D = ϕ GEP −
11 + β ( κ/ (cid:18) βκ x + 3 k x (cid:19) . (18)The terms with label A originate from laser pulse A. The terms with label C originate from self-phase modulation and cross-phase modulation. The terms with label D originate from self-diffraction. C. Interference pattern
The camera at position z = L detects the intensity I FWM ( x, ϕ GEP ) = (cid:12)(cid:12)(cid:12) ˜ E FWM L ( ω = ω , x ) (cid:12)(cid:12)(cid:12) . (19)To analyze the interferences, the expression for the intensity is separated into terms that are inde-pendent respectively dependent on the GEP: I FWM ( x, ϕ GEP ) = I FWM0 ( x ) + I FWMGEP ( x, ϕ GEP ) (20)with I FWM0 ( x ) = (cid:12)(cid:12) A L e λ A (cid:12)(cid:12) + (cid:12)(cid:12) C L e λ C (cid:12)(cid:12) + (cid:12)(cid:12) D L e λ D (cid:12)(cid:12) + 2Re { (cid:0) A L e λ A e iφ A (cid:1) (cid:0) C L e λ C e iφ C (cid:1) ∗ } (21)and I FWMGEP ( x, ϕ GEP ) = 2Re { I AD e iφ AD } + 2Re { I CD e iφ CD } I AD = A L e λ A D ∗ L ( e λ D ) ∗ I CD = C L e λ C D ∗ L ( e λ D ) ∗ φ AD = φ A − φ D = − ϕ GEP −
11 + β ( κ/ (cid:18) βκ x + k x (cid:19) + 11 + β ( κ/ (cid:18) βκ x + 3 k x (cid:19) φ CD = φ C − φ D = − ϕ GEP + 11 + β ( κ/ (2 k x ) . (22)The expressions for φ AD and φ CD in equation (22) reveal that the τ -dependent interferences havea phase that depends on x . With the parameters of Figure 2, βκ = 3.7e-13 and k = 4.27e-06, so thephase depends essentially linearly on x and can be approximated by φ AD ≈ − ϕ GEP + (cid:32) −
11 + β ( κ/ + 31 + β ( κ/ (cid:33) k xφ CD ≈ − ϕ GEP + 2 k β ( κ/ x. (23) -10 -5 0 5 10 τ (fs) x ( mm ) × -3 Figure 2: Interferences in FWM according to equation (19). The displayed region of x includes the edge of pulseA (at the bottom of the figure) and the center of the first diffraction order next to A, which is centered at about x = 0 . mm. See Figure 1 for the position of the camera. The parameters used are (in atomic units): A = 1, B = 0.1, ω = 0.067, k = 4.27e-06, κ = 8.75e+11, σ = 6.16e+04, πω lc χ (3) = 1, L = ◦ , a beam waist of 70 µ m and a propagation distance of 15 mm. The delay scans displayed in Figure 2 reveal oscillations with the periodicity of the optical cycle.The oscillations are most dominant in the region between pulse A and the first diffraction order, andthey are tilted in the x - τ -diagram. The first contribution to these oscillations is interference with phase φ AD between the first diffraction order and pulse A. This contribution is dominant in the experimentreported in Ref. [13]. Another contribution, which is weaker in the experiment, is interference withphase φ CD between the the first diffraction order and light from self-phase modulation and cross-phase modulation.The oscillations are visible only for few-groove gratings, which corresponds to small crossingangles and small beam waists. For larger crossing angles, the oscillations diminish very quickly(see Figure 3). However, for comparison with an experiment where a medium with finite thickness isused, it needs to be considered that nonlinear defocusing in the sample widens the divergence angle,which enhances the contrast of the oscillations. -10 -5 0 5 10 τ (fs) x ( mm ) × -3 Figure 3: Same as Figure 2, except that the crossing angle is slighly increased to 1.4 ◦ . IV. EVENLY-SPACED FILAMENTATIONA. Nonlinear response
When laser pulses A and B intersect in the nonlinear medium at position z = 0 , the instantaneousintensity is ( E A ( t, x ) + E B ( t, x )) = F F F A F B cos( − k x + ϕ GEP )+ F ω t − k x + 2 ϕ CEP )+ F ω t + 2 k x − ϕ GEP + 2 ϕ CEP )+ F A F B cos(2 ω t − ϕ GEP + 2 ϕ CEP ) . (24)The time-average reveals the form of a grating, (cid:68) ( E A ( t, x ) + E B ( t, x )) (cid:69) = F F F A F B cos(2 k x − ϕ GEP ) , (25)with maxima at positions x max,n = nπk + ϕ GEP k .The numerical calculation in Ref. [13] shows that the grooves of the intensity grating are muchsteeper at the end of the medium compared to the beginning of the medium. This can be understoodas the result of multiple filamentation, where the filaments do not build up at random positions dueto wavefront distortions, but where the filaments are triggered by the grating at the beginning ofthe medium. The initial intensity distribution of the grating acts like a micro-lens array that initiatesevenly-spaced filaments [9]. Here it is important to note that the steepening of the filaments causesself-diffraction. The reason is that the steepening of the filaments broadens of the spatial frequencies,and the even spacing of the filaments corresponds to spatial harmonics (diffraction orders) in the farfield.It may be argued that the two mechanisms for self-diffraction that are treated here, FWM and ESF,are not two distinct mechanisms, but interpretations of one effect, because both mechanisms originatefrom the nonlinear response of the medium. The conception of two separate mechanisms is nourishedby two findings: i) self-diffraction can be treated by FWM only, without inclusion of filamentation. Thiscase is treated in section III. It is also treated in Ref. [13], where the approximation of the numericalcalculation (neglecting diffraction inside the sample) leads to self-diffraction without self-focusing. ii)ESF is very similar to diffraction on a real micro-lens array, like it is done in Ref. [9].To investigate the self-diffraction that arises due to ESF with a simple model, it is assumed thatthe intensity distribution after the medium is given by I ( x ) = I e − κ x + ∞ (cid:88) q =0 a q cos(2 qk o x − qϕ GEP ) . (26)The coefficients a q depend of course on the pulse delay τ . At large pulse delays, the modulationdepth of the intensity grating at the beginning of the medium is reduced. However, it is not straight-forward to calculate explicitly the filamentation that follows, since this is a highly nonlinear process.Therefore the exact functional form of the coefficients a q will be omitted here. The GEP-dependenceof the Fourier components in equation (26) follows from the condition that the Fourier componentsshould interfere constructively at positions x max,n .Within the present model, it is assumed that the electric field after the medium is given by ˜ E ESF ( ω, x ) = (cid:16) ˜ E A ( ω, x ) + ˜ E B ( ω, x ) (cid:17) + ∞ (cid:88) q =0 b q cos(2 qk o x − qϕ GEP ) . (27)The camera detects only the spatial region of laser pulse A and the neighboring diffraction or-der. Therefore, corresponding to the approximation made in equation (7), only the terms with phasedependencies − k x and − k x need to be accounted for: ˜ E ESF ( ω = ω , x ) = e − κ x (cid:18) A b e − ik x + A b e − ik x e iω τ + B b e − ik x + B b e − ik x e iω τ (cid:19) . (28) B. Pulse propagation
The Fourier transform of the field after the medium is ˆ E ESF ( ω = ω , k ) ∝ (cid:18)(cid:18) A b + B b (cid:19) e − κ ( k + k ) + (cid:18) A b B b (cid:19) e − κ ( k +3 k ) e iω τ (cid:19) . (29)Pulse propagation by the distance L and subsequent inverse Fourier transform can be performedsimilarly as in section III B. The final expression is ˜ E ESF L ( x ) ∝ K L e λ K e iφ K + M L e λ M e iφ M (30)with the definitions0 K L = (cid:18) A b + B b (cid:19) (cid:114) ζ e − κ (1 − ζ ) k M L = (cid:18) A b B b (cid:19) (cid:114) ζ e − κ (1 − ζ )(3 k ) λ K = −
11 + β ( κ/ (cid:18) κ ( x − k β ) − k β κ (cid:19) φ K = −
11 + β ( κ/ (cid:18) βκ x + k x (cid:19) λ M = −
11 + β ( κ/ (cid:18) κ ( x − k β ) − k ) β κ (cid:19) φ M = ϕ GEP −
11 + β ( κ/ (cid:18) βκ x + 3 k x (cid:19) . (31) C. Interference pattern
The camera at position z = L detects the intensity I ESF ( x, ϕ GEP ) = (cid:12)(cid:12)(cid:12) ˜ E ESF L ( x ) (cid:12)(cid:12)(cid:12) . (32)To analyze the interferences, the expression for the intensity is separated into terms that are inde-pendent respectively dependent on the GEP: I ESF ( x, ϕ GEP ) = I ESF0 ( x ) + I ESFGEP ( x, ϕ GEP ) (33)with I ESF0 ( x ) = (cid:12)(cid:12) K L e λ K (cid:12)(cid:12) + (cid:12)(cid:12) M L e λ M (cid:12)(cid:12) (34)and I ESFGEP ( x, ϕ GEP ) = 2Re { I KM e iφ KM } I KM = K L e λ K (cid:0) M L e λ M (cid:1) ∗ φ KM = φ K − φ M = − ϕ GEP + 11 + β ( κ/ (2 k x ) . (35)The expression for φ KM is identical to the epxression for φ CD in equation (22). Therefore, the τ -dependent interferences have a phase that depends on x in the same way as in section III.As in the case of FWM, the delay scans displayed in Figure 4 reveal oscillations with the periodicityof the optical cycle, and the oscillations are most dominant in the region between pulse A and the firstdiffraction order. Also, the interference fringes are tilted in the x - τ -diagram. The intensity of thediffraction order and the strength of the interferences should be reduced for large pulse delays andvanish for no pulse overlap. This is not reproduced by the present model, because the dependenceof the coefficients a q in equation (26), respectively b q in equation (27), on the pulse delay τ is omitted.1 -10 -5 0 5 10 τ (fs) x ( mm ) × -3 Figure 4: Interferences in ESF according to equation (33). See Figure 1 for the position of the camera. The sameparameter values are used as in Figure 2; additional parameters for ESF are: b = 1, b = 0.1, b = 0.1. V. LOCALIZED TRANSMISSION CHANGESA. Nonlinear response
Here it is considered that the medium is not homogeneous in lateral direction ( x -direction), butrather exhibits localized changes in its transmission. As discussed in Ref. [13], the underlying reasonfor these localized transmission changes could be manifold. One contribution could be localizedoptical damage in the medium, presumably caused by one of the filaments that are initiated by thelaser-induced grating. Another contribution could be processes with high-order nonlinearity, suchas nonlinear absorption, which occur most dominantly if a filament forms at the peak of the spatialenvelope.To investigate localized transmission changes with a simplified model, it is assumed that the elec-tric field after the medium is given by E LTC ( t, x ) = E ( t, x )(1 − T e − ξ x ) , (36)where E ( t, x ) is the field before the medium. This assumption means essentially that the trans-mission is altered by the factor − T inside a narrow region with lateral extent √ ξ .To reproduce the interference pattern that is observed in the experiment, the interplay of LTC withFWM and with ESF must be analyzed. Since FWM and ESF yield almost identical interferences(see Figures 2 and 4), the following discussion is restricted to the interplay of LTC with FWM. Theinterplay of LTC and ESF leads essentially to the same result. The electric field after the medium withinfinitesimal thickness l , altered by both FWM and LTC, is given by ˆ E LTC ( ω = ω , k ) = ˆ E FWM ( ω = ω , k )(1 − T e − ξ x ) (37)where ˆ E FWM is defined in equation (13). To avoid very lengthy equations in the following, the approx-imation ˆ E LTC ( ω = ω , k ) = ˆ E FWM ( ω = ω , k ) − T A e − η ( k + k ) (38)with η = κξκ + ξ is made. The full calculation can be done equivalently and does not significantly alter2the appearance of Figures 5 and 6. B. Pulse propagation
The free space propagation from the medium to the camera is calculated similarly as in sectionIII B. The electric field at the macroscopic distance L is ˆ E LTC L ( ω = ω , k ) = ˆ E LTC ( ω = ω , k ) e iβk = ˆ E FWM L ( ω = ω , k ) − T A e − η ( k + k ) e iβk . (39)The inverse Fourier transform yields ˜ E LTC L ( ω = ω , x ) = ˜ E FWM L ( ω = ω , x ) + H L e − i k ζη x e − ηζη x (40)with the definitions ζ η = 1 − i βηH L = − T A (cid:115) ζ η e − η (1 − ζη ) k . (41)Corresponding to equation (17), the real and imaginary parts in the exponential functions aregrouped: ˜ E LTC L ( ω = ω , x ) = ˜ E FWM L ( ω = ω , x ) + H L e λ H e iφ H = A L e λ A e iφ A + C L e λ C e iφ C + D L e λ D e iφ D + H L e λ H e iφ H (42)with the definitions λ H = −
11 + β ( η/ (cid:18) η ( x − k β ) − k β η (cid:19) φ H = −
11 + β ( η/ (cid:18) βη x + k x (cid:19) . (43) C. Interference pattern
The camera detects the intensity I LTC ( x, ϕ GEP ) = (cid:12)(cid:12)(cid:12) ˜ E LTC L ( ω = ω , x ) (cid:12)(cid:12)(cid:12) . (44)To analyze the interferences, the expression for the intensity is separated into terms that are inde-pendent respectively dependent on the GEP: I LTC ( x, ϕ GEP ) = I LTC0 ( x ) + I LTCGEP ( x, ϕ GEP ) . (45)3 -10 -5 0 5 10 τ (fs) x ( mm ) × -3 -10 -5 0 5 10 τ (fs) x ( mm ) × -3 a)b) Figure 5: Interferences caused by LTC according to equation (45). See Figure 1 for the position of the camera.The same parameter values are used as in Figure 2; additional parameters that determine the LTC are: T = a) respectively T = i for b) and ξ = (1 − T ) has a lateral extent of √ ξ = µ m, which corresponds to the width of the filamentsthat form in the numerical calculation in Ref. [13]). Compared to the analysis in section III, there is one additional term that is dependent on the GEP: I LTCGEP ( x, ϕ GEP ) = I FWMGEP ( x, ϕ GEP ) + 2Re { I HD e iφ HD } I HD = H L e λ H (cid:0) D L e λ D (cid:1) ∗ φ HD = φ H − φ D = − ϕ GEP −
11 + β ( η/ (cid:18) βη x + k x (cid:19) + 11 + β ( κ/ (cid:18) βκ x + 3 k x (cid:19) . (46)According to equation (46), φ HD does also exhibit a dependence on x . However, this dependenceis negligible with the parameters of Figure 5, so φ HD can be approximated by φ HD ≈ − ϕ GEP . (47)4The delay scans displayed in Figure 5 reveal two distinguishable oscillations with the periodicityof the optical cycle. First, there are oscillations in the region between pulse A and the first diffractionorder which are tilted in the x - τ -diagram. This interference pattern has already been observed insection III (see Figure 2) and are therefore attributed to four-wave mixing. Second, there are oscilla-tions on the first diffraction order which are vertical in the x - τ -diagram. This interference pattern is notpresent in section III, therefore it is attributed to localized transmission changes. Both absorption (cor-responding to a real parameter T , see Figure 5 a) ) and phase-shift (corresponding to an imaginaryparameter T , see Figure 5 b) ) lead to the second kind of interference pattern. -10 -5 0 5 10 τ (fs) x ( mm ) × -3 Figure 6: Isolated interferences caused by LTC. Displayed is I iso ( x ) according to equation (48), without theapproximation (47), with the same parameter values as in Figure 5 a) . See Figure 1 for the position of the camera. The second kind of interference pattern is represented by the term { I HD e iφ HD } in equation 46.To analyze the second kind of interference pattern isolated from the first kind of interference pattern,the quantity I iso ( x ) = (cid:12)(cid:12) D L e λ D e iφ D + H L e λ H e iφ H (cid:12)(cid:12) (48)is displayed in Figure 6. This confirms the observation that the second kind of interference pat-tern, which is caused by localized changes in transmission, is vertical in the x - τ -diagram and mostpronounced in the region of the diffraction order.It is evident from equation (46) that the slope of the interference fringes in the x - τ -diagram dependson ξ . The more localized the transmission changes are (the smaller the parameter ξ ), the weaker isthe tilt in the x - τ -diagram. For FIGs. 5 - 6, the transmission changes are confined to a region of √ ξ = µ m, and the spacing of the grooves is π/ (2 k ) = 39 µ m. The calculations show that if the localizationof the transmission changes is small compared to the groove spacing, than the interference fringesappear essentially vertical.There is an interesting connection in the position-time analogy between GEP and CEP. The time-domain analogue to localization within a groove period is temporal localization within an optical cycle.Processes that are localized within the optical cycle are usually strong-field phenomena, such asstrong-field ionization and high-order harmonic generation. These processes also depend on theCEP for laser pulses in the few-cycle regime.5 VI. CONCLUSION
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