Phase-controlled SnO2 and SnO growth by atomic layer deposition using Bis(N-ethoxy-2,2-dimethyl propanamido)tin precursor

Abstract

Abstract Atomic layer deposition (ALD) of SnO and SnO 2 thin films was successfully demonstrated over a wide temperature range of 70–300\u202f°C using a divalent Sn-precursor, bis( N- ethoxy-2,2-dimethyl propanamido)tin (Sn(edpa) 2 ). The regulated growth of the SnO 2 and SnO films was realized by employing O 2 -plasma and H 2 O, respectively. Pure SnO 2 and SnO films were deposited with negligible C and N contents at all the growth temperatures, and the films exhibited polycrystalline and amorphous structures, respectively. The SnO 2 films presented a high transmittance of >\u202f85% in the wavelength range of 400–700\u202fnm and an indirect band gap of 3.6–4.0\u202feV; meanwhile, the SnO films exhibited a lower transmittance of >\u202f60% and an indirect band gap of 2.9–3.0\u202feV. The SnO 2 films exhibited n-type semiconducting characteristics with carrier concentrations of 8.5\u202f×\u202f10 16 –1.2\u202f×\u202f10 20 cm −3 and Hall mobilities of 2–26\u202fcm 2 /V\u202fs. By employing an alternate ALD growth of SnO and SnO 2 films, SnO 2 /SnO multilayer structures were successfully fabricated at 120\u202f°C. The in-situ quadrupole mass spectrometry analysis performed during ALD revealed that the oxidation of chemisorbed Sn-precursor occurs dominantly during the Sn(edpa) 2 /O 2 -plasma ALD process, resulting in the production of combustion by-products, whereas the Sn(edpa) 2 /H 2 O ALD process was governed by a ligand exchange reaction with the maintenance of the original oxidation state of Sn 2+ .