Effect of structural deformations on the transport properties of half-doped manganite nanowires: An insight through high resolution image simulation

Abstract

Abstract Study of structural deformations in manganite nanowires (NWs) are strongly required as in one dimensional (1D) NWs the structural deformations contribute hugely in controlling the electronic properties of the NWs. High resolution image simulation technique has been applied to resolve the atomic structure of a complex layered crystal, (La1−xCaxMnO3; x \xa0=\xa00.3 and 0.5), which comprises a high density of distorted lattice interfaces. This technique allows us to study lattice imperfections, like stacking disorder, twinning and layer undulations, with atomic scale resolution. Aberration corrected High Resolution Electron Microscopy (HREM) images directly reveals the projected crystal structure. Here it is obtained by exploring the strong suppression of image delocalization and using certain spherical-aberration coefficient (Cs) imaging conditions. It has been explained and correlated that the disordered system formation in NWs is due to the defects (termination of sites) in atomic column.