Simulation of optical properties of ellipsoidal monocapillary X-ray optics with inner-surface imperfections

Abstract

Abstract Ellipsoidal monocapillary x-ray optics are used as condenser lenses in full-field transmission x-ray microscopy. The numerical aperture (NA) of the ellipsoidal monocapillary is designed to match that of the x-ray zone plate objective. In practice, monocapillaries have inner-surface errors that lead to mismatches between the monocapillary and the zone plate. In this study, mathematical models of monocapillaries with elliptic cross-section deformation and centreline straightness errors were developed, respectively. Furthermore, the optical properties of these monocapillaries were simulated based on a ray-tracing method. The simulation provides a qualitative picture of the NA and illumination angle distributions of the ellipsoidal monocapillary with inner-surface errors, and it is useful for predicting the inner-surface imperfections from the x-ray ring behind the monocapillary.