Influence of geometrical alignment of the deformation microstructure on local migration of grain boundaries during recrystallization: A phase-field study

Abstract

Abstract Effects of the geometrical alignment of an idealized deformation microstructure on the migration of recrystallization boundaries are studied using a phase-field model. A deformation field consisting of two sets of regularly arranged bands is used as an example to mimic typical deformed microstructures, while the migration of both initially flat and circular recrystallization boundaries are considered. The results show that for both cases the local variations in the deformation field affect not only the local shape of the migrating boundary but also the overall distances traveled. It is revealed that boundary migration into heterogeneously distributed energy fields are not uniform neither in space nor time, and can therefore not be expressed by the classic migration model with a uniform migration assumption, even when averaged over the whole boundary and long time.