High-energy particle analysis

Abstract

Abstract Materials analysis with ion beams exploits the interaction of ions with the electrons and nuclei in the sample. Among the vast variety of possible analytical techniques available with ion beams, this chapter confines itself to ion beam analysis with hydrogen ions having an energy of about 70\xa0MeV. The interaction of these ions with the electrons in the sample produces holes in the inner electronic shells of the sample atoms, which recombine and emit X-rays characteristic of the element in question. Particle-induced X-ray emission is shown to be a fast technique for the analysis of elements with an atomic number above 11.