Unique Challenges, Solutions and Methodologies for Planetary Sample Analyses

Abstract

We have developed innovative focused ion beam (FIB) sample preparation methods that allow us to perform coordinated analyses of planetary materials using combinations of ion microprobe, synchrotron-based instruments, and transmission electron microscopy (TEM) measurements on the same sample. We discuss several examples below utilizing the focused ion beam (FIB), TEM and other instruments at the NASA Johnson Space Center.