Use of Negative Bias Potential for High Throughput Array Tomography in an Integrated Light-Electron Microscope

Abstract

Volume electron microscopy (EM) has progressively become a driving force in exploring and analysing three-dimensional biological structures across ever-increasing spatial scales. While advances in technology and automation have revolutionized imaging capabilities, low throughput persists as the primary limitation to achieving larger and larger volumes [1]. One strategy for increasing throughput is to combine a fluorescence and electron microscope together into one integrated system. Doing so provides the advantage of being able to use fluorescence expression as a guide for selecting regions of interest for high resolution EM imaging [2].