Combined imaging and analytical STEM of ultra-thin cuprate films

Abstract

Considerable advances in scanning transmission electron microscopy (STEM) have revealed fascinating phenomena in functional complex oxide materials at the atomic scale. Simultaneous acquisition of annular bright-field (ABF) and high-angle annular dark-field (HAADF) STEM images opened up an elegant path for combined imaging of light and heavy elements. Furthermore, combining STEM imaging with advanced analytical methods, such as electron energy-loss spectroscopy (EELS) and energy-dispersive X-ray spectroscopy (EDX), sets an exceptionally powerful approach to study very thin films.