Atomic Force Microscopy Nanomechanics of Hard Nanometer-Thick Films on Soft Substrates: Insights into Stretchable Conductors

Abstract

The nanomechanical properties of ultrathin and nanostructured films of rigid electronic materials on soft substrates are of crucial relevance to realize materials and devices for stretchable electronics. Of particular interest are bending deformations in buckled nanometer-thick films or patterned networks of rigid materials as they can be exploited to compensate for the missing tensile elasticity. Here, we perform atomic force microscopy indentation experiments and electrical measurements to characterize the nanomechanics of ultrathin gold films on a polydimethylsiloxane (PDMS) elastomer. The measured force-indentation data can be analyzed in terms of a simple analytical model describing a bending plate on a semi-infinite soft substrate. The resulting method enables us to quantify the local Young’s modulus of elasticity of the nanometer-thick film. Systematic variation of the gold layer thickness reveals the presence of a diffuse interface between the metal film and the elastomer substrate that does not contribute to the bending stiffness. The effect is associated with gold clusters that penetrate the silicone and are not directly connected to the ultrathin film. Only above a critical layer thickness, percolation of the metallic thin film happens, causing a linear increase in bending stiffness and electrical conductivity.