Noise spectroscopy as a tool for the characterization of perovskite, organic and silicon solar cells

Abstract

Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under temperature or radiation stress. For all the investigated polymer:fullerene, silicon and perovskite solar cells this technique evidences a clear correlation of the recombination and the transport processes with the device performances.Low-frequency noise spectroscopy has been used to monitor electronic properties of solar cells under temperature or radiation stress. For all the investigated polymer:fullerene, silicon and perovskite solar cells this technique evidences a clear correlation of the recombination and the transport processes with the device performances.