Hydrogen depth profile determination of materials by elastic recoil detection analysis

Abstract

Detection of elastically scattered recoils instead of projectiles offers the possibility to hydrogen depth profile determination of samples and is still a quantitative method for materials analysis. ERDA is combined with Rutherford back scattering (RBS) and particle induced X-ray emission (PIXE), allowing the simultaneous characterization of the hydrogen content and depth profile for important industrial materials. The surface area of the samples was contaminated by hydrogen to the depth of hundreds of nm, depending on the individual sample. The hydrogen content ranged from 3.3 to 10.5 %.Detection of elastically scattered recoils instead of projectiles offers the possibility to hydrogen depth profile determination of samples and is still a quantitative method for materials analysis. ERDA is combined with Rutherford back scattering (RBS) and particle induced X-ray emission (PIXE), allowing the simultaneous characterization of the hydrogen content and depth profile for important industrial materials. The surface area of the samples was contaminated by hydrogen to the depth of hundreds of nm, depending on the individual sample. The hydrogen content ranged from 3.3 to 10.5 %.