Surface-Scanning Raman Characterization of Dark Materials Based on a Digital Mirror Device (DMD)

Abstract

Abstract When Raman spectroscopy is used for material analysis, a laser is focused on the sample by a lens. Dark materials have a stronger ability to absorb light and hence the laser may heat these samples to the ignition point. Thus, Raman spectroscopy of dark materials is a challenging problem. High-frequency surface scanning technology based on a digital mirror device and Lissajous pattern modulation is presented in this study. The scanning was performed according to a given path in the detection process and the sampling area was changed from point source detection to area source detection. In addition, the optical structure of the handheld Raman spectrometer was optimized by changing relevant optical components. In addition, the detection efficiency and detection limit were improved so that its performance was significantly enhanced.