Electrochemically-triggered degradation of silicon membranes for smart on-demand transient electronic devices.

Abstract

Transient electronics is an emerging technology that enables unique functional transformation or physical disappearance of electronic devices, and is attracting increasing attention for potential applications in data secured hardware as an ultimate solution against data breaches. Developing smart triggered degradation modalities of silicon (Si) remain the key challenge to achieve advanced non-recoverable on-demand transient electronics. Here, we present a novel electrochemically-triggered transience mechanism of Si by lithiation, allowing complete and controllable destruction of Si devices. The depth and microstructure of lithiation-affected zone over time is investigated in detail and the results suggest a few hours of lithiation is sufficient to create microcracks and significantly promote Li penetration. Finite element models are proposed to confirm the mechanism. Electrochemically-triggered degradation of thin film Si ribbons and Si integrated circuit (IC) chips with metal-oxide-semiconductor field-effect transistors (MOSFETs) from a commercial 0.35 micrometers complementary metal-oxide-semiconductor (CMOS) technology node is performed to demonstrate the potential applications for commercial electronics. This work opens new opportunities for versatile triggered transience of Si based devices for critical secured information systems and green consumer electronics.