Particle creation and annihilation in a dynamically disordered totally asymmetric simple exclusion process.

Abstract

We study a single-channel dynamically disordered totally asymmetric simple exclusion process with bulk particle attachment and detachment. The continuum mean-field equations are derived and solved numerically to obtain steady-state phase diagrams and density profiles. The effects of various parameters, namely particle attachment rate, defect binding and unbinding rates, and binding constant, have been investigated. An increase in the attachment rate of particles reduces the number of steady-state phases, whereas a variation in defect binding and unbinding rates shifts the phase boundaries. One of the important consequences of introducing particle nonconserving dynamics is the appearance of shock in the steady state. The shock dynamics have been thoroughly examined and the defect strength is found to have a significant effect on the shock position. The mean-field solutions are validated using extensive Monte Carlo simulations.