Process Yield Index and Variable Sampling Plans for Autocorrelation Between Nonlinear Profiles

Abstract

In this paper, a process yield-index for autocorrelation between nonlinear profiles is proposed. Applying a one-dimensional Taylor series expansion, the mean and variance of the estimator of the yield index are derived. To evaluate the performance of the proposed yield index a simulation study is conducted. The new index is employed to design three acceptance sampling plans for quality characteristics described by auto-correlated nonlinear profiles. The first sampling plan is based on resubmission. The remaining two follow the repetitive group and multiple dependent repetitive sampling schemes respectively. For all sampling plans, the operating characteristic function is developed. A non-linear optimization approach with search algorithm is employed to determine the number of profiles required for inspection and to decide critical values for acceptance, rejection, and resubmission criteria. The performance of the new methods is investigated and compared with traditional single sampling plan. The comparison confirms all of the three proposed methods possess higher efficiency than a single sampling plan in terms of sample size. For practical applications tables are provided. Two numerical examples from the automobile engine testing and particleboard manufacturing process are used to demonstrate the applicability of the proposed methods.