A New Solution of Power Management Integrated Circuit One Time Programable Test

Abstract

PMIC (Power Management Integrated Circuit) is the primary power management building block for multiple kinds of ICs (Processor, memory and miscellaneous peripherals). OTP (One Time Programable) test is used for trimming identical original PMIC devices to different versions as per different customers requirement. Conventional OTP test solutions have constraints in flexibility, ease of use or cost aspects. This paper presents a new OTP test solution which breaks conventional OTP test solutions constraints. It is a reliable, flexible and easy to use low-cost OTP ATE (Automatic Test Equipment) test solution without using conventional testers.