Analysis of High-Frequency Dielectric Plates Applicator Effects to Accelerate Ripening in Fruit Using NIR Hyperspectral Imaging

Abstract

This paper presents a high-frequency dielectric applicator for ripening fruit. In this study, we demonstrate with the electric field applicator is designed with two plates at 2450 MHz and gets power at 120 W (MUEGGE MR1000D) to generate power into the material. Simulation results show that the power loss density. This dielectric property was tested by using bananas as an example for the experiment. The conditions for the experiment were divided into four cases as follows: dielectric material a) without electric field, b) under the electric field for 3 minutes, c) under the electric field for 5 minutes, and d) under the electric field for 10 minutes. The dielectric properties of bananas are not stable, depending on the power absorbed at that time. In exceptional, condition (a) has a number of dielectric properties different from other conditions. The electric field will affect to reduce the dielectric constant. Results of dielectric properties was measured by open-ended coaxial dielectric probe kit (N1501A, Keysight Technology) connected to a vector network analyzer (E5071C, Keysight Technology) that can be operated in the range of 0.5–10 GHz. The results of physical material was measured using NIR hyperspectral imaging (Specim FX17e) following formats: RGB Image, and PCA Model 2D contour.