Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method

Abstract

In LSI testing, equivalent time sampling techniques are frequently used because the input signals to the device under test and the sampling clock are controllable; when the repetitive input signals are applied to the analog device under test, its output signals can be also repetitive. In this paper, we investigate an efficient waveform acquisition method with the equivalent-sampling using the metallic ratio of the sampling frequency and the input frequency, which is expected to be used for on-line, short-time and simple analog/RF/mixed-signal IC testing.