Unknown Interference Source Positioning Based on Near-Field Scanning

Abstract

The positioning of electromagnetic interference (EMI) sources is of high importance in electromagnetic compatibility applications. In this paper, a method for interference source positioning based on near-field scanning is proposed. Known reference sources and the unknown device under test(DUT) are placed between shielding planes. Due to the multi patches effect, the radiated near-fields from the DUT only shows larger correlation with that from the reference source very close to the DUT. According to this, by scanning the electric near-field around the shielding planes and calculating the correlation coefficients, the position of the DUT can be estimated. The proposed method is validated by simulations examples, and both a single interference source and two interference sources can be predicted. Simulation results confirm that the proposed method can be used in interference source positioning.