Effects of Natural Aging in Biaxial MEMS Accelerometers

Abstract

Effects of a fully natural aging of MEMS accelerometers are evaluated with regard to changes in their performance. Two models of commercial dual-axis accelerometers (two pieces of ADXL 202E and 203 by Analog Devices Inc.) with analog outputs were tested over a period of about 10 and 4 years, respectively. A custom computer controlled test rig was used for performing relevant experimental studies, employing the gravitational acceleration as the reference source. A methodology of determining the proposed indicators of aging phenomena is presented and discussed. Changes of the offset voltage and the scale factor were observed and a way of evaluating the overall error due to combined influence of these two parameters is proposed. It was found out that the changes of the output voltage generated by the tested accelerometers were considerable, resulting in respective maximal errors of about 52 mg (2.6%) (ADXL 202E) or 20 mg (1%) (ADXL 203). Simple ways of reducing the effects of aging are proposed.