Terahertz quantitative metrology using 300 GHz in-line digital holography

Abstract

Continuous-wave THz digital holography (DH) is an advanced interference imaging technique, which can be used to reconstruct the amplitude and phase distributions of a sample. In this paper, an in-line holographic system is presented using a 300 GHz source and a highly sensitive broadband CMOS TeraFET (THz Field-Effect Transistor) detector. Numerical reconstruction is achieved using the angular spectrum approach. Experimental results are presented for a sample made of Polyvinyl Chloride (PVC). The results demonstrate that THz digital holography can be readily applied to perform quantitative metrology and may find many applications in 3D digital imaging and microscopy.