X-ray speckle-based phase-contrast imaging: principle and applications

Abstract

X-ray speckle-based imaging (SBI), one of them most recent phase-contrast imaging methods, has received growing interest in the last years. Its simplicity, cost-effectiveness and robustness combined with the high phase sensitivity and compatibility with laboratory X-ray sources make it an attractive method for visualising even minute density differences in samples. Since its first demonstration, SBI has seen rapid development and a range of applications have been identified. Among the various ways to perform SBI, the unified modulated pattern analysis (UMPA) offers a number of advantages. Here, we present an overview of the state of the art of SBI, including some of our work using UMPA in the recent years. We demonstrate the potential of UMPA for applications such as optics characterisation, biomedical and geological imaging and discuss its translation from large-scale synchrotron facilities to the laboratory.