Polymer Science Series A | 2019

Signature of Reptation in the Long-Time Behavior of the Simulated Free Induction Decay in High Molecular Mass Polymer Melt

 

Abstract


The comparison of the recently obtained experimental [Polymer 142 (2018) 310] and simulated FID is first represented for an entangled polymer melt far from the glass transition temperature. The FIDs resulting from only the intra-segmental dipolar interaction have been simulated by two independent methods. First, the FID was modeled with the help of the mean square displacement for the middle primitive segments of the chain. Second, the FID was designed by means of the reduced FID theoretical definition, which takes into account only the residual dipolar coupling of the middle or all Kuhn segments of the chain.

Volume 61
Pages 392-396
DOI 10.1134/S0965545X19030118
Language English
Journal Polymer Science Series A

Full Text