2019 41st Annual EOS/ESD Symposium (EOS/ESD) | 2019
ESD Protection Impact and Modelling of Bias-Dependent Series Resistance in Diodes
Abstract
An investigation of different forward-bias and reverse-bias on-resistance in diodes is presented. The impact of this often neglected effect on ESD protection design is demonstrated. A macro-model of a diode has been developed to account for the bias dependent resistance. This has been used in SPICE-type circuit level ESD simulation.