Electronics | 2021

NDF of Scattered Fields for Strip Geometries

 
 
 

Abstract


Solving inverse scattering problems by numerical methods requires investigating the number of independent pieces of information that can be reconstructed stably. To this end, we address the evaluation of the Number of Degrees of Freedom (NDF) of far-zone scattered fields for some strip geometries under the first-order Born approximation. The analysis is performed by employing the Singular Value Decomposition (SVD) of the scattering operator in the two-dimensional scalar geometry of one or more strips illuminated by a TM polarized plane wave. It is known that investigating the scattering scene at different incident plane waves (multi-view configuration) enhances the NDF. Therefore we mean to examine the minimum number of incident plane waves providing the NDF of the scattered fields both by theoretical estimations and numerical verifications.

Volume 10
Pages 202
DOI 10.3390/ELECTRONICS10020202
Language English
Journal Electronics

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