Sensors (Basel, Switzerland) | 2019

SLIC Superpixel-Based l2,1-Norm Robust Principal Component Analysis for Hyperspectral Image Classification

 
 
 
 
 
 
 

Abstract


Hyperspectral Images (HSIs) contain enriched information due to the presence of various bands, which have gained attention for the past few decades. However, explosive growth in HSIs’ scale and dimensions causes “Curse of dimensionality” and “Hughes phenomenon”. Dimensionality reduction has become an important means to overcome the “Curse of dimensionality”. In hyperspectral images, labeled samples are more difficult to collect because they require many labor and material resources. Semi-supervised dimensionality reduction is very important in mining high-dimensional data due to the lack of costly-labeled samples. The promotion of the supervised dimensionality reduction method to the semi-supervised method is mostly done by graph, which is a powerful tool for characterizing data relationships and manifold exploration. To take advantage of the spatial information of data, we put forward a novel graph construction method for semi-supervised learning, called SLIC Superpixel-based l2,1-norm Robust Principal Component Analysis (SURPCA2,1), which integrates superpixel segmentation method Simple Linear Iterative Clustering (SLIC) into Low-rank Decomposition. First, the SLIC algorithm is adopted to obtain the spatial homogeneous regions of HSI. Then, the l2,1-norm RPCA is exploited in each superpixel area, which captures the global information of homogeneous regions and preserves spectral subspace segmentation of HSIs very well. Therefore, we have explored the spatial and spectral information of hyperspectral image simultaneously by combining superpixel segmentation with RPCA. Finally, a semi-supervised dimensionality reduction framework based on SURPCA2,1 graph is used for feature extraction task. Extensive experiments on multiple HSIs showed that the proposed spectral-spatial SURPCA2,1 is always comparable to other compared graphs with few labeled samples.

Volume 19
Pages None
DOI 10.3390/s19030479
Language English
Journal Sensors (Basel, Switzerland)

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