Lightweight Microcontroller with Parallelized ECC-Based Code Memory Protection Unit for Robust Instruction Execution in Smart Sensors

Abstract

Embedded systems typically operate in harsh environments, such as where there is external shock, insufficient power, or an obsolete sensor after the replacement cycle. Despite these harsh environments, embedded systems require data integrity for accurate operation. Unintended data changes can cause a serious error in reduced instruction set computer (RISC)-based small embedded systems. For instance, if communication is performed on an edge, where there is insufficient power supply, the peak threshold is not reached, resulting in data transmission failure or incorrect data transmission. To ensure data integrity, we use an error-correcting code (ECC), which can detect and correct errors. The ECC parity bit and data are stored together using additional ECC memory, and the original data are extracted through the ECC decoding process. The process of extracting the original data is executed in the instruction fetch stage, where a bottleneck appears in the RISC-based structure. When the ECC decoding process is executed in the bottleneck, the instruction fetch stage increases the instruction fetch time and significantly reduces the overall performance. In this study, we attempt to minimize the effect of ECC on the transmission speed by executing the ECC decoding process in parallel to improve speed by degrading the bottleneck. To evaluate the performance of a parallelized ECC decoding block, we applied the proposed method to the tiny processing unit (TPU) with a RISC-based von Neumann structure and compared memory usage, speed, and reliability according to different transmission success rates in each model. The experiment was conducted using a benchmark that repeatedly executed several 3*3 matrix calculations, and reliability improvement was compared by corrupting the stored random date to confirm the reliability of the transmission success rate. As a result, in the proposed model, using the additional parity bits for parallel processing, memory usage increased by 10 bits per instruction, reducing the data rate from 80 to 61%. However, it showed an improvement in overall reliability and a 7% increase in speed.