Materials Science Forum | 2019

Dynamic Switching of 3kV 4H-SiC Charge-Balanced Junction Barrier Schottky (JBS) Diodes

 
 
 
 
 

Abstract


We have performed detailed dynamic switching measurements for 3kV 4H-SiC Charge-Balanced (CB) junction barrier Schottky (JBS) diodes [1,2] and studied their dependence on device design parameters. We have done forward and reverse recovery characterizations and found unusual switching characteristics in these CB-JBS diodes. These switching characteristics are explained based on the design and layout of the devices.

Volume 1004
Pages 939 - 944
DOI 10.4028/www.scientific.net/MSF.1004.939
Language English
Journal Materials Science Forum

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