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Dive into the research topics where A. A. Bernussi is active.

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Featured researches published by A. A. Bernussi.


Journal of Applied Physics | 2012

Structural, electrical, and terahertz transmission properties of VO2 thin films grown on c-, r-, and m-plane sapphire substrates

Yong Zhao; Joon Hwan Lee; Yanhan Zhu; M. Nazari; Changhong Chen; Haiyan Wang; A. A. Bernussi; M. Holtz; Zhaoyang Fan

The structure, metal-insulator transition (MIT), and related Terahertz (THz) transmission characteristics of VO2 thin films obtained by sputtering deposition on c-, r-, and m-plane sapphire substrates were investigated by different techniques. On c-sapphire, monoclinic VO2 films were characterized to be epitaxial films with triple domain structure caused by β-angle mismatch. Monoclinic VO2 β angle of 122.2° and the two angles of V4+–V4+ chain deviating from the am axis of 4.4° and 4.3° are determined. On r-sapphire, tetragonal VO2 was determined to be epitaxially deposited with VO2 (011)T perpendicular to the growth direction, while the structural phase transformation into lower symmetric monoclinic phase results in (2¯11) and (200) orientations forming a twinned structure. VO2 on m-sapphire has several growth orientations, related with the uneven substrate surface and possible inter-diffusion between film and substrate. Measurements of the electrical properties show that the sample on r-sapphire has MIT ...


Applied Physics Letters | 2010

VO2 multidomain heteroepitaxial growth and terahertz transmission modulation

Changhong Chen; Yanhan Zhu; Yong Zhao; Joon Hwan Lee; Haiyan Wang; A. A. Bernussi; M. Holtz; Zhaoyang Fan

We report the epitaxial relationship of VO2 thin-films on c-plane sapphire and their terahertz transmission modulation with temperature. The films exhibit a triple-domain structure caused by the lattice mismatch between monoclinic VO2 and sapphire hexagon. The epitaxial relationship is determined to be VO2[010]∥Al2O3[0001] and VO2(2¯02)∥Al2O3{112¯0}, with the in-plane lattice mismatch of 2.66% (tensile) along [2¯02] and the out-of-plane lattice mismatch of −2.19% (compressive). Terahertz measurements revealed that VO2 films have over fourfold change in transmission during the metal-insulator transition, indicating a strong potential for terahertz wave switching and modulation applications.


IEEE Photonics Journal | 2009

Image Formation in Wide-Field Microscopes Based on Leakage of Surface Plasmon-Coupled Fluorescence

S. Frisbie; C.F. Chesnutt; M.E. Holtz; A. Krishnan; L.G. de Peralta; A. A. Bernussi

A proof-of-concept imaging technique that combines the advantages of wide-field surface plasmon, leakage radiation, and total internal reflection fluorescence microscopy methods is presented. High-contrast non-scanning images with subwavelength resolution of patterned and homogeneous samples coated with a fluorescent material were demonstrated. We show that the image formed in the back focal plane of the objective lens can be reconstructed from the image of the samples surface using an algorithm similar to that used in computerized tomographic imaging. Our experimental results suggest that there is a 1-D Fourier transform relationship between any line amplitude profile at a given angle passing through the center of the samples surface image and a line amplitude profile passing through the center of the back-focal-plane image at the same angle.


Journal of Applied Physics | 2011

Influence of defects on structural and electrical properties of VO2 thin films

Changhong Chen; Yong Zhao; Xuan Pan; V. Kuryatkov; A. A. Bernussi; M. Holtz; Zhaoyang Fan

We present the structural and electrical properties of (011) preferred polycrystalline (Poly) and multidomain (020) epitaxial (Epi) VO2 thin films grown at different temperature (Ts) and on different substrates with variable defects. These defects cause variation in strain, metal-insulator transition (MIT) temperature (TMIT), activation energy (ΔEa), and charge carrier type in insulating phase. Both the Poly- and Epi-VO2 behave n-type conductivity when grown at relative low TS. As TS increases, defects related acceptor density increases to alter conductivity from n- to p-type in the Poly-VO2, while in the Epi-VO2 donor density increases to maintain n-type conductivity. Moreover, the strain along monoclinic am axis dramatically reverses from tensile to compressive in both the Poly- (848 K < TS < 873 K) and Epi-VO2 (873 K < TS < 898 K), and eventually approaches to a constant in the Poly-VO2 (TS ≥ 898 K) in particular. TMIT decreases with increasing the carrier density independent of the conductive type in ...


Optics Letters | 2013

Tunable dual-band terahertz metamaterial bandpass filters

Yanhan Zhu; Subash Vegesna; Yong Zhao; V. Kuryatkov; M. Holtz; Zhaoyang Fan; Mohammad A. Saed; A. A. Bernussi

We report metamaterial terahertz (THz) bandpass filters with tunable dual-band selectivity. The shift in the center frequency of the device is achieved by actively modifying the effective length of the resonators. This was realized by introducing vanadium dioxide (VO2) bridges interconnecting specific regions of each resonator. Raising the temperature across the phase transition shifted the resonance frequency by ~32% due to changes in the electrical conductivity of the VO2. Measured THz transmission response of the proposed dual-band filter was in good correspondence with simulations.


IEEE Photonics Technology Letters | 2003

Reflective arrayed waveguide grating multiplexer

L.G. de Peralta; A. A. Bernussi; S. Frisbie; R. Gale; H. Temkin

A high-performance reflective arrayed waveguide grating multiplexer/demultiplexer designed for compatibility with silicon integrated circuit processing is described. The grating, folded by a flat reflecting surface, can be printed in a single-exposure field of a photolithographic stepper. Advanced plasma assisted deposition is used to prepare waveguides with very low loss and minimum birefringence. Multiplexers with 40 channels separated by 100 GHz show intrinsic insertion losses of -2.4 dB, channel uniformity less than 0.6 dB, and very low polarization dependent wavelength shift of 0.012 nm.


Journal of The Optical Society of America B-optical Physics | 2012

Effect of substrate orientation on terahertz optical transmission through VO 2 thin films and application to functional antireflection coatings

Yanhan Zhu; Yong Zhao; M. Holtz; Zhaoyang Fan; A. A. Bernussi

We report studies of the terahertz (THz) transmission through vanadium dioxide (VO2) thin films grown on c-, m-, and r-plane sapphire substrates. Our results revealed THz amplitude modulation as large as 84% for VO2 films grown on r-plane sapphire substrates upon crossing the metal–insulator phase transition temperature. Complex optical conductivity and refractive indices were determined for all investigated samples in the metallic state. Results are consistent with electrical resistivity measurements and described based on the Drude model. The real and imaginary parts of the optical conductivity and refractive index are obtained, and associations with variations in the grain morphology and crystal quality are described. We show that VO2 thin films can be used as tunable broadband THz frequency antireflecting coatings.


Journal of Applied Physics | 2013

Tuning the properties of VO2 thin films through growth temperature for infrared and terahertz modulation applications

Yong Zhao; Changhong Chen; Xuan Pan; Yanhan Zhu; M. Holtz; A. A. Bernussi; Zhaoyang Fan

Results are reported on tuning the electrical and optical properties of sputter-deposited vanadium dioxide (VO2) thin films through control of substrate growth temperature (Ts). As Ts increases from 550 to 700 °C, the morphology changes from granular to smooth film and finally to rough film. X-ray diffraction shows the presence of VO2 along with additional weak features related to the presence of non-stoichiometric phases. Electrical measurements show the phase transition to change from abrupt to gradual as both the below- and above-transition resistivities vary with Ts. The transition and hysteresis dependences observed in electrical resistivity are similarly observed in infrared transmission. Terahertz transmission measurements show that high conductivity above the phase transition is more important in achieving high modulation depth than obtaining high resistivity below the transition. We attribute changes in the electrical and optical properties to the formation of V and O vacancies, which result in diverse valence states from the ideal V4+ of VO2. Low Ts produces material with V5+ states resulting in higher resistivity in both the insulating and metallic phases. Alternatively, high Ts introduces material with V3+ states leading to lower resistivity in the insulating phase but slightly higher resistivity in the metallic phase.


Optics Letters | 2012

Terahertz bandpass filters using double-stacked metamaterial layers

Yanhan Zhu; Subash Vegesna; V. Kuryatkov; M. Holtz; Mohammad A. Saed; A. A. Bernussi

Bandpass filters are reported based on double-stacked metamaterial layers separated by an air gap for operation at terahertz frequencies. Several stacking configurations were investigated designed for a ~0.5 THz center frequency. The filters exhibited improved spectral transmission properties when compared with conventional ones based on single metamaterial layers. 3 dB bandwidth of ~78 GHz and sidelobe suppression ratio >16 dB were determined when symmetric or asymmetric double layers were stacked. We demonstrate that superior frequency selectivity can be achieved when metamaterial layers with different unit cells are used. Good agreement was found between measured and simulated transmission response.


Optics Express | 2012

Imaging nanoscale features with plasmon-coupled leakage radiation far-field superlenses

C. J. Regan; R. Rodriguez; Shivkumar Gourshetty; Luis Grave de Peralta; A. A. Bernussi

Optical images from nano-scale features were obtained by collection of leakage radiation coupled to surface plasmon polaritons excited by near-field fluorescence. Plasmonic crystals with spatial periods as small as 190 nm and non-periodic features separated by 80 nm, corresponding to ~λ/7, were clearly visible in the real plane images using this far-field technique. We show that the leaked light from the investigated samples carries detailed information to the far-field which is not present in the images obtained with conventional optical microscopy.

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M. Holtz

Texas State University

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H. Temkin

Texas Tech University

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