A.D. Acharya

Effect of deposition temperature on structural and optical properties of sprayed nickel oxide thin films

NiO thin films were prepared by spray pyrolysis technique on preheated glass substrate. The effect of deposition temperature on the structural, morphological and optical properties was studied by XRD, AFM and UV-visible spectrophotometer. XRD analysis indicated polycrystalline cubic structure of sprayed films with (111) preferred orientation. It has been found that optical absorption behavior and surface morphology of the films can be controlled by substrate temperature. UV-visible spectra shows that the absorption edges of sprayed films shift to short wavelength with increasing deposition temperature.

Electrical properties of Fe doped NiO thin films

Undoped and Fe doped nickel oxide thin films were grown on glass substrate by chemical spray pyrolysis technique using NiCl2 6H2O as the precursor solution. Fe concentrations in the films were varied from 0-10 %. The effect of doping on the properties such as microstructure and resistivity were studied. The prepared films are reproducible, adherent to the substrate and uniform.

Effect of Cu‐doping on Nanocrystalline NiO Thin Films

Undoped and Cu doped nickel oxide thin films were grown on glass substrate by chemical spray pyrolysis technique using NiCl2.6H2O as the precursor solution. Cu concentrations in the films were varied from 0–10%. The effect of doping on the properties such as microstructure and resistivity were studied. Structural studies of the prepared samples show that the doping % influences the microstructure as well as the crystalline quality of films. The resistivity and activation energy of the above film decreases with the increase in copper concentration. The prepared films are reproducible, adherent to the substrate and uniform.

Investigation of Cd‐doped and Undoped ZnO Thin Films

Cd doped ZnO thin films have been prepared by spray pyrolysis technique with different cadmium concentrations at temperature 400 °C. The structural, morphological and electrical properties of Cd doped ZnO films were studied. X‐ray diffraction (XRD) and Atomic Force Microscopy (AFM) measurements reveal that the films formed in polycrystalline nature and grain size, roughness of the films decreases with Cd concentration. Two probe resistivity measurements indicate that the films are semiconducting in nature up to room temperature and just above the room temperature hump shows the transition in the films. This transition is due to spin fluctuation via exchange interaction. The various characterizations clearly indicate the incorporation of Cd ion at Zn site in ZnO thin film.