A.E. Rowan
Radboud University Nijmegen
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Archive | 1999
P. Vanoppen; Johan Hofkens; L. Latterini; K. Jeuris; Herman Faes; F. C. De Schryver; J. Kerimo; Paul F. Barbara; A.E. Rowan; Roeland J. M. Nolte
Imaging techniques, such as Confocal Fluorescence Microscopy (CFM) or Near-field Scanning Optical Microscopy (NSOM) [1, 2] are essential techniques to study complex heterogeneous organic thin films by mapping their optical properties. They are complementary techniques having different advantages and disadvantages [3]. CFM is relatively easy to apply and combines a lateral resolution approaching λ/2 with the possibility of layered imaging in the z-direction. In contrast, NSOM has significantly better spatial resolution and offers simultaneous optical and topographic images. Although confocal microscopy has been mostly used for biological applications, the technique has proven to be useful, for example, in the study of colloids [4,5], polymer blends [6] and liquid crystals [7,8].
Chemical Reviews | 2005
Dennis M. Vriezema; Marta Comellas Aragonès; Johannes A. A. W. Elemans; Jeroen J. L. M. Cornelissen; A.E. Rowan; Roeland J. M. Nolte
Journal of the American Chemical Society | 2002
Kelly Velonia; A.E. Rowan; Roeland J. M. Nolte
Journal of the American Chemical Society | 1996
Fokke Venema; A.E. Rowan; Roeland J. M. Nolte
Journal of the American Chemical Society | 2005
Johan Hoogboom; Paula M. L. Garcia; Matthijs B. J. Otten; Johannes A. A. W. Elemans; J. Sly; Sergiy V. Lazarenko; T.H.M. Rasing; A.E. Rowan; Roeland J. M. Nolte
Industrial & Engineering Chemistry Research | 2000
Johannes A. A. W. Elemans; A.E. Rowan; Roeland J. M. Nolte
Langmuir | 1999
L. Latterini; R. Blossey; Johan Hofkens; P. Vanoppen; F. C. De Schryver; A.E. Rowan; Roeland J. M. Nolte
Journal of the American Chemical Society | 2002
Johannes A. A. W. Elemans; A.E. Rowan; Roeland J. M. Nolte
Journal of Organic Chemistry | 2003
Johannes A. A. W. Elemans; Ralf R.J. Slangen; A.E. Rowan; Roeland J. M. Nolte
Journal of Porphyrins and Phthalocyanines | 2006
Johannes A. A. W. Elemans; R. van Hameren; S. Speller; Roeland J. M. Nolte; A.E. Rowan