A. F. Monsen

Comparison of TEM specimen preparation of perovskite thin films by tripod polishing and conventional ion milling

In this article, the effects of the transmission electron microscopy (TEM) specimen preparation techniques, such as ion milling and tripod polishing on perovskite oxides for high-resolution TEM investigation, are compared. Conventional and liquid nitrogen cooled ion milling induce a new domain orientation in thin films of SrRuO(3) and LaFeO(3) grown on (001)-oriented SrTiO(3) substrates. This is not observed in tripod-polished specimens. Different ion milling rates for thin films and substrates in cross-section specimens lead to artefacts in the interface region, degrading the specimen quality. This is illustrated by SrRuO(3) and PbTiO(3) thin films grown on (001)-oriented SrTiO(3). By applying tripod polishing and gentle low-angle, low-energy ion milling while cooling the sample, the effects from specimen preparation are reduced resulting in higher quality of the TEM study. In the process of making face-to-face cross-section specimens by tripod polishing, it is crucial that the glue layer attaching the slabs of material is very thin (<50 nm).

One-dimensional spin texture of Bi(441): Quantum spin Hall properties without a topological insulator

The high index (441) surface of bismuth has been studied using scanning tunneling microscopy (STM), angle resolved photoemission spectroscopy (APRES), and spin-resolved ARPES. The surface is strongly corrugated, exposing a regular array of (110)-like terraces. Two surface localized states are observed, both of which are linearly dispersing in one in-plane direction (k(x)), and dispersionless in the orthogonal in-plane direction (k(y)), and both of which have a Dirac-like crossing at k(x) = 0. Spin ARPES reveals a strong in-plane polarization, consistent with Rashba-like spin-orbit coupling. One state has a strong out-of-plane spin component, which matches with the miscut angle, suggesting its possible origin as an edge state. The electronic structure of Bi(441) has significant similarities with topological insulator surface states and is expected to support one-dimensional quantum spin Hall-like coupled spin-charge transport properties with inhibited backscattering, without requiring a topological insulator bulk.

In-plane structural order of domain engineered La0.7Sr0.3MnO3thin films

We present a detailed structural study of tensile-strained La0.7Sr0.3MnO3 thin films. We use the substrate miscut to control the number of rhombohedral variants in the films and study the in-plane order and structural distortions. Using high-resolution X-ray diffraction, we demonstrate that step-edge induced lattice modulations occur in 4-variant films, whereas periodic twinning is the dominant in-plane order for 2-variant films. We show that the in-plane twinning angle is almost completely relaxed. However, the relaxation of shear strain by the out-of-plane twinning angle and the monoclinic distortion is only partial. Furthermore, the film thickness dependence of the domain width reveals that domain formation is a universal mechanism for shear strain relaxation. Finally, we show that the structural response to the transition from the paramagnetic to the ferromagnetic phase of La0.7Sr0.3MnO3 at 345 K is smaller in 4-variant films compared to 2-variant films.

Comparison TEM specimen preparation of perovskite thin films by conventional Ar ion milling and tripod polishing

Perovskites are a class of materials showing a number of interesting properties such as ferroelectricity, ferromagnetism, high-Tc superconductivity, gigantic magnetoresistance or combinations of these [1]. These properties can be exploited in thin film devices in which the pervoskite films can be grown with high quality and precision using a range of deposition techniques. In order to implement these materials into thin film devices, it is necessary to understand size- and interface effects [2]. TEM is an important tool for achieving this understanding.