A. G. de Oliveira

Characterizing reference locality in the WWW

The authors propose models for both temporal and spatial locality of reference in streams of requests arriving at Web servers. They show that simple models based on document popularity alone are insufficient for capturing either temporal or spatial locality. Instead, they rely on an equivalent, but numerical, representation of a reference stream: a stack distance trace. They show that temporal locality can be characterized by the marginal distribution of the stack distance trace, and propose models for typical distributions and compare their cache performance to the traces. They also show that spatial locality in a reference stream can be characterized using the notion of self-similarity. Self-similarity describes long-range correlations in the data set, which is a property that previous researchers have found hard to incorporate into synthetic reference strings. They show that stack distance strings appear to be strongly self-similar, and provide measurements of the degree of self-similarity in the traces. Finally, they discuss methods for generating synthetic Web traces that exhibit the properties of temporal and spatial locality measured in the data.

Coherent-to-incoherent transition in surfactant mediated growth of InAs quantum dots

In this letter, we present an atomic force microscopy study of a series of Te-mediated InAs/GaAs samples with InAs coverage ranging from 1.5 to 3 monolayers. We were able to directly identify the growth mode transition and the mechanism of relaxed island formation. At the limit of coherent growth mode, strained quantum dots aggregate, forming twin quantum dots (TQDs), which are structures of two, or more, dots virtually bonded together, separated by less than 3 nm. The onset of the incoherent mode is then unambiguously characterized by the coalescence of individual TQDs forming initially small, and then larger, relaxed islands.

Direct observation of the coexistence of coherent and incoherent InAs self-assembled dots by x-ray scattering

In this letter, grazing incidence x-ray scattering is employed as a method to identify relaxed islands in an ensemble of partially coherent self-assembled InAs quantum dots. A simple model of strained pyramidal islands enables the association of the local lattice parameter of an island to its lateral size. A comparison between the island side length and its strain state allows the identification of coherent and incoherent nanostructures, revealing the size–strain interplay during growth.

On three dimensional self-organization and optical properties of InAs quantum-dot multilayers

We report on experiments aimed at producing three-dimensional self-organization in InAs quantum-dot multilayers embedded in GaAs. These InAs/GaAs quantum-dot multilayers have been grown by molecular beam epitaxy. Employing atomic force microscopy, we have analyzed the island density in samples with different number of periods of InAs/GaAs bilayers The results reveals a decrease and a tendency to saturation of the island density with an increase in the number of periods, as a three-dimensional self-organization characteristic of these samples. Optical properties of the samples are examined via photoluminescence spectroscopy. The evolution of the quantum-dot photoluminescence peak position indicates an increment in the mean size of the buried islands and a relative homogenization in size of the quantum dots, as the number of periods increases. The results of the optical measurements agree with the morphological data, and characterize a spatial process of self-organization, related to the increment of the nu...

Structural and optical characterization of Mg-doped GaAs nanowires grown on GaAs and Si substrates

We report an investigation on the morphological, structural, and optical properties of large size wurtzite GaAs nanowires, low doped with Mg, grown on GaAs(111)B and Si(111) substrates. A higher density of vertical nanowires was observed when grown upon GaAs(111)B. Very thin zinc-blende segments are observed along the axis of the nanowires with a slightly higher linear density being found on the nanowires grown on Si(111). Low temperature cathodoluminescence and photoluminescence measurements reveal an emission in the range 1.40–1.52 eV related with the spatial localization of the charge carriers at the interfaces of the two crystalline phases. Mg related emission is evidenced by cathodoluminescence performed on the GaAs epilayer. However, no direct evidence for a Mg related emission is found for the nanowires. The excitation power dependency on both peak energy and intensity of the photoluminescence gives a clear evidence for the type II nature of the radiative transitions. From the temperature dependence on the photoluminescence intensity, non-radiative de-excitation channels with different activation energies were found. The fact that the estimated energies for the escape of the electron are higher in the nanowires grown on Si(111) suggests the presence of wider zinc-blende segments.

Temperature-dependent activation energy and variable range hopping in semi-insulating GaAs

We measured resistivity in the range of 30–390 K on four semi-insulating low-temperature grown molecular-beam epitaxy GaAs samples. The growth temperature range was from 215 °C to 315 °C. Arrhenius fittings with T−1 and hopping fitting with T−1/4 do not permit us the definition of the temperature ranges controlled by band and hopping conduction, respectively. This leads to major errors in the calculation of both activation energies and hopping parameters. We have used the differential activation energy in order to clearly identify the temperature range for the different transport mechanisms. Hopping dominates at low temperatures and band conduction at high temperatures. In-between, a mixed conduction regime is observed. We introduce a criterion to clearly define the temperature range of hopping, band and mixed conduction. The lower temperature at which mixed conduction is identified decreases for samples with increasing growth temperature. Only the sample grown at 215 °C presents both forms of hopping conduction before entering the mixed conduction regime. Hopping parameters were obtained from the fittings of the differential activation energy and the values are in good agreement with the usual method of calculating them if the correct temperature range is used.

The effect of the planar doping on the electrical transport properties at the Al:n-GaAs(100) interface : ultrahigh effective doping

Measurements of the current density as a function of the applied bias have been performed to study the electronic properties of the Al:n‐GaAs(100) interface. The samples were grown by molecular beam epitaxy. A Si planar doping was placed in GaAs(100) at different depths underneath the metal‐semiconductor interface and the charge transport across this interface has been investigated. An increasing tunneling contribution to the net current through the Schottky barrier has been observed by decreasing the planar doping depth. For sufficiently small depths, the tunneling current dominated. Planar doping near the metal‐semiconductor interface was found to be equivalent, concerning charge transport properties, to a bulk semiconductor doped well beyond the currently achievable limit.

X-ray determination of vertical ordering of InAs quantum dots in InAs/GaAs multilayers

The degree of vertical alignment of InAs quantum dots in InAs/GaAs(001) multilayers was studied using grazing incidence x-ray scattering. We show that it is necessary to access one of the weak (200) x-ray reflections to observe the modulation of the GaAs lattice periodicity produced by the stacking of the InAs dots. The degree of alignment of the dots was assessed by fitting the x-ray diffuse scattering profiles near a GaAs (200) reciprocal lattice point. By using a model of gaussian lateral displacement of the dots, we show that we can determine the average value of the mistake in stacking positions of the islands from one bilayer to the next.

Field-enhanced trapping in deep levels by multiple phonon emission in semi-insulating GaAs

We have carried out the time, temperature, and illumination dependencies of the current density in a semi-insulating GaAs sample grown at 300 °C under strong electric field. Standard ohmic behavior was observed at room temperature. A negative differential behavior as a function of the applied electric field was observed by lowering the temperature and increasing the photon flux, and this phenomenon was associated to the field-enhanced trapping effect. We have fit our data with a model for enhanced capture by a multiple-phonon emission capture process assisted by the applied electrical field.

Broadening of the Si doping layer in planar-doped GaAs in the limit of high concentrations

Abstract A series of samples of GaAs planar doped with Si, grown by MBE at low substrate temperatures and with different doping concentrations, is investigated. A comparison of Shubnikov-de Haas measurements and self-consistent numerical calculations shows that a broadening of the doped region occurs in spite of the low growth temperature. The broadening occurs via segregation of the Si impurities with the growth surface when the solid solubility limit of Si in GaAs is exceeded. For the growth conditions used this limit is determined to be (2.1 ± 0.2) × 1019 cm−3. At high doping densities an intrinsic compensation mechanism becomes active, limiting the concentration of conduction electrons.