A. Jabłońska

Modelling studies of amorphous In-Se films

Abstract The wide-angle X-ray scattering studies on amorphous In–Se films with selenium content of 60 and 66 at.% are reported. The intensities were recorded in the scattering vector range between 0.3 and 16 A −1 . The intensity functions have been simulated using the Debye relationship for a series of models based on structures of crystalline counterparts. The best agreement with the experimental data has been achieved for the In–Se structure, in which In and Se are tetrahedrally and three-fold coordinated, respectively.

Structural studies of amorphous In–Se by EXAFS

Amorphous In–Se films containing 50, 60 and 66 at.% Se, prepared by vacuum evaporation, have been studied by extended X-ray absorption fine structure (EXAFS) at the In K-edge. A least-squares fitting procedure has been used to derive structural information about the In environment. The results indicate that In is tetrahedrally coordinated and for In50Se50 each In atom has one In nearest neighbor at 2.75 A and three Se nearest neighbors at 2.63 A. The number of In–In bonds decreases with increasing Se content.