A. K. Schmid
Lawrence Berkeley National Laboratory
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Featured researches published by A. K. Schmid.
Nature Materials | 2008
Shuyun Zhou; David Siegel; A. V. Fedorov; F. El Gabaly; A. K. Schmid; A. H. Castro Neto; D. Lee; Alessandra Lanzara
We studied the effect of quantum confinement on the size of the band gap in single layer epitaxial graphene. Samples with different graphene terrace sizes are studied by using low energy electron microscopy (LEEM) and angle-resolved photoemission spectroscopy (ARPES). The direct correlation between the terrace size extracted from LEEM and the gap size extracted from ARPES shows that quantum confinement alone cannot account for the large gap observed in epitaxial graphene samples.
Review of Scientific Instruments | 2010
C. Jozwiak; Jeff Graf; Gennadi Lebedev; Nord Andresen; A. K. Schmid; A. V. Fedorov; F. El Gabaly; Weishi Wan; Alessandra Lanzara; Z. Hussain
We describe a spin-resolved electron spectrometer capable of uniquely efficient and high energy resolution measurements. Spin analysis is obtained through polarimetry based on low-energy exchange scattering from a ferromagnetic thin-film target. This approach can achieve a similar analyzing power (Sherman function) as state-of-the-art Mott scattering polarimeters, but with as much as 100 times improved efficiency due to increased reflectivity. Performance is further enhanced by integrating the polarimeter into a time-of-flight (TOF) based energy analysis scheme with a precise and flexible electrostatic lens system. The parallel acquisition of a range of electron kinetic energies afforded by the TOF approach results in an order of magnitude (or more) increase in efficiency compared to hemispherical analyzers. The lens system additionally features a 90 degrees bandpass filter, which by removing unwanted parts of the photoelectron distribution allows the TOF technique to be performed at low electron drift energy and high energy resolution within a wide range of experimental parameters. The spectrometer is ideally suited for high-resolution spin- and angle-resolved photoemission spectroscopy (spin-ARPES), and initial results are shown. The TOF approach makes the spectrometer especially ideal for time-resolved spin-ARPES experiments.
Applied Physics Letters | 2012
Nicolas Rougemaille; Alpha T. N'diaye; Johann Coraux; Chi Vo-Van; Olivier Fruchart; A. K. Schmid
Magnetic properties of nanometer-thick Co films intercalated at the graphene/Ir(111) interface are investigated using spin-polarized low-energy electron microscopy and Auger electron spectroscopy. We show that the graphene top layer promotes perpendicular magnetic anisotropy in the Co film underneath, even for relatively thick intercalated deposits. The magnetic anisotropy energy is significantly larger for the graphene/Co interface than for the free Co surface. Hybridization of the graphene and Co electron orbitals is believed to be at the origin of the observed perpendicular magnetic anisotropy.
Journal of Physics: Condensed Matter | 2009
Bárbara Santos; Elena Loginova; A. Mascaraque; A. K. Schmid; K. F. McCarty; J. de la Figuera
We have grown epitaxial films a few atomic layers thick of iron oxides on ruthenium. We characterize the growth by low energy electron microscopy. Using selected-area diffraction and intensity-versus-voltage spectroscopy, we detect two distinct phases which are assigned as wüstite and magnetite. Spin-polarized low energy electron microscopy reveals magnetic domain patterns in the magnetite phase at room temperature.
Journal of Vacuum Science and Technology | 2009
Barış Ünal; Y. Sato; Kevin F. McCarty; N. C. Bartelt; T. Duden; Cynthia J. Jenks; A. K. Schmid; Patricia A. Thiel
the work function of the LEEM instrument i.e., of the electron emitter cathode is determined.Using this calibration procedure, we find =4.75–4.91 V for the quasicrystal surface, where the rangeof values is due to the range of literature values for the cleanelemental surfaces that served as benchmarks and also par-tially due to the consistency in the work function determina-tion of the LEEM instrument. The literature work functions
Physical Review B | 2005
Jeff Graf; Chris Jozwiak; A. K. Schmid; Z. Hussain; Alessandra Lanzara
Spin Polarized Low Energy Electron Microscopy is used as a spin dependent spectroscopic probe to study the spin dependent specular reflection of a polarized electron beam from two different magnetic thin film systems: Fe/W(110) and Co/W(110). The reflectivity and spin-dependent exchange-scattering asymmetry are studied as a function of electron kinetic energy and film thickness, as well as the time dependence. The largest value of the figure of merit for spin polarimetry is observed for a 5 monolayer thick film of Co/W(110) at an electron kinetic energy of 2eV. This value is 2 orders of magnitude higher than previously obtained with state of the art Mini-Mott polarimeter. We discuss implications of our results for the development of an electron-spin-polarimeter using the exchange-interaction at low energy.
Physical Review B | 2007
N. Rougemaille; Marco Portalupi; Alberto Brambilla; Paolo Biagioni; Alessandra Lanzara; Marco Finazzi; A. K. Schmid; L. Duò
Using spin-polarized low-energy electron microscopy to study magnetization in epitaxial layered systems, we found that the area vs perimeter relationship of magnetic domains in the top Fe layers of
Scientific Reports | 2016
Anh Duc Vu; Johann Coraux; Gang Chen; Alpha T. N’Diaye; A. K. Schmid; Nicolas Rougemaille
\mathrm{Fe}∕\mathrm{Ni}\mathrm{O}∕\mathrm{Fe}(100)
Physical Review B | 2009
David Siegel; Shuyun Zhou; F. El Gabaly; A. K. Schmid; K. F. McCarty; Alessandra Lanzara
structures follows a power-law distribution, with very small magnetic domain cutoff radius (about
New Journal of Physics | 2009
J Choi; J Wu; F. El Gabaly; A. K. Schmid; Chanyong Hwang; Z. Q. Qiu
40\phantom{\rule{0.3em}{0ex}}\mathrm{nm}