A. Keith Powell

Broadband Mo∕Si multilayer transmission phase retarders for the extreme ultraviolet

Experimental results on aperiodic broadband transmission molybdenum/silicon multilayer phase retarders for the extreme ultraviolet range are presented. The broadband phase retarders were designed using a numerical method and made using direct current magnetron sputtering on silicon nitride membrane. The polarization properties of these aperiodic transmission phase retarders have been investigated using the soft x-ray polarimeter at BESSY-II. The measured phase shift was about 42° in the wavelength range of 13.8–15.5nm, and the corresponding s-component transmission (Ts) decreased from 6% to 2% with increasing wavelength.

Complete polarization analysis of extreme ultraviolet radiation with a broadband phase retarder and analyzer

The polarization state of the BESSY UE56/1-PGM beamline radiation in the broad wavelength range of 12.7–15.5nm was measured using a molybdenum/silicon transmission phase retarder and a reflection analyzer with aperiodic multilayer interference structures, which can broaden the spectral response of these optical elements. The characteristics of the circular polarized undulator radiation, as well as the polarization properties of the two polarizing elements, were determined by a complete polarization analysis. Furthermore, the polarization of the radiation as a function of the undulator shift setting was also measured at the wavelength of 13.1nm by use of the broadband phase retarder-analyzer pair.

Broadband multilayer polarizers for the extreme ultraviolet

Nonperiodic molybdenum/silicon broadband multilayer polarizers have been designed using numerical optimization algorithm and fabricated using direct current magnetron sputtering. Their performances have been characterized using the high precision eight-axis soft x-ray polarimeter at the BESSY facility. Different multilayers have measured s-polarized reflectivities of 27% at 13.1nm and higher than 15% over the wavelength range of 13–19nm. Nearly constant s reflectivity, up to 37%, is observed over the 15–17nm wavelength range, where the degree of polarization is more than 98%. Furthermore, these multilayer polarizers also show high s reflectivity and polarization over a broad angular range at fixed wavelength.

Extreme ultraviolet broadband Mo/Y multilayer analyzers

Broadband extreme ultraviolet molybdenum/yttrium aperiodic multilayer analyzers were designed for polarization experiments in 8.5–11.7nm wavelength range. The multilayer analyzers were made using direct current magnetron sputtering and characterized using the soft x-ray polarimeter at BESSY-II facility. Measured s reflectivities at the Brewster angle are 5.5% for a multilayer designed for 8.5–10.1nm wavelength range and 6.1% for one designed for 9.1–11.7nm. The multilayers also exhibit high polarization degree up to 98.79%. In addition, the multilayer was also measured over 38°–52° angular range at the fixed wavelength of 10.2nm and the mean s reflectivity is 6.2%.

Active microstructured arrays for x-ray optics

The UK Smart X-Ray Optics programme is developing the techniques required to both enhance the performance of existing X-ray systems, such as X-ray telescopes, while also extending the utility of X-ray optics to a broader class of scientific investigation. The approach requires the control of the inherent aberrations of X-ray systems using an active/adaptive method. One of the technologies proposed to achieve this is micro-structured optical arrays, which use grazing incidence reflection through consecutive aligned arrays of channels. Although such arrays are similar in concept to polycapillary and microchannel plate optics, they are more flexible. Bending the arrays allows variable focal length, while flexing parts of them provides adaptive or active systems. Custom configurations can be designed, using ray tracing and finite element analysis, for applications from sub-keV to several-keV X-rays. The channels may be made using deep silicon etching, which can provide appropriate aspect ratios, and flexed using piezo actuators. An exemplar application will be in the micro-probing of biological cells and tissue samples using Ti Kα radiation (4.5 keV) in studies related to radiation induced cancers.

Active Microstructured Optical Arrays of Grazing Incidence Reflectors

The UK Smart X-Ray Optics (SXO) programme is developing active/adaptive optics for terrestrial applications. One of the technologies proposed is microstructured optical arrays (MOAs), which focus X-rays using grazing incidence reflection through consecutive aligned arrays of microscopic channels. Although such arrays are similar in concept to polycapillary and microchannel plate optics, they can be bent and adjusted using piezoelectric actuators providing control over the focusing and inherent aberrations. Custom configurations can be designed, using ray tracing and finite element analysis, for applications from sub-keV to several-keV X-rays, and the channels of appropriate aspect ratios can be made using deep silicon etching. An exemplar application will be in the microprobing of biological cells and tissue samples using Ti K α radiation (4.5 keV) in studies related to radiation-induced cancers. This paper discusses the optical design, modelling, and manufacture of such optics.

On the Possibility of Quantum Coherence in Biological Systems with Application to Quantum Computing

The recent rapid advances in silicon based electronics and the information processing technology it has generated cannot be expected to continue. Of the obstacles which lie in the way, perhaps the most fundamental is that of the quantum mechanical restrictions imposed by the discrete nature of matter and the way it interacts over the short length scales envisaged for future generations of electronic components.

Multilayer mirror design for different applications in the XUV using a versatile simulation program

By combining previous multilayer optics design methods a multilayer mirror program has been developed to provide a versatile tool for multilayer mirror (MLM) design for the XUV range. The optimization program allows variation of the angle of incident radiation, the interface roughness and the number of different materials within the MLM structure. The possibility of optimizing the performance of the MLM using different merit functions or reflectivity profiles has been implemented and makes this program a powerful tool for the design of different multilayer devices. Polarizers have been designed by optimizing at the Brewster angle, and ratios of Rs|Rp around 103 are achieved for specific wavelengths. To select a specific line from a superimposed line and continuum spectrum from an electron impact or laser plasma source, a selective merit function is used. Applications include the calculation of Al Kα and Ti Kα electron impact source radiation monochromators for the use in microbeam radiation experiments. Other ideas for MLMs where the maximal reflected wavelength is dependent on the angle of incidence are currently being studied. These MLMs are planned for the use in achieving tunability of a microscope running with a continuum source.