A. Oelsner

Microspectroscopy and imaging using a delay line detector in time-of-flight photoemission microscopy

A method for microspectroscopy and energy-selective imaging using a special photoemission electron microscope (PEEM) is presented. A modified commercial PEEM was combined with a delay line device as x, y, t detector serving as the basic arrangement for spectromicroscopy. One can measure the time of flight of the electrons passing a drift section in order to analyze the energy distribution of photoelectrons in PEEM. The time of flight is referenced to the time structure of the synchrotron radiation from an electron storage ring. At electron kinetic energies of less than 20 eV within the drift region a spatial resolution of about 100 nm has been obtained. Fast counting electronics (instead of a camera) delivers an image for real-time monitoring on an oscilloscope screen or for image acquisition by a computer. A time resolution of about 500 ps has been obtained with the potential of further improvement. The spatial resolution of the delay line detector is about 50 μm in the image plane corresponding to 1000 ...

Time-of-flight-photoelectron emission microscopy on plasmonic structures using attosecond extreme ultraviolet pulses

We report on the imaging of plasmonic structures by time-of-flight-photoemission electron microscopy (ToF-PEEM) in combination with extreme ultraviolet (XUV) attosecond pulses from a high harmonic generation source. Characterization of lithographically fabricated Au structures using these ultrashort XUV pulses by ToF-PEEM shows a spatial resolution of ∼200 nm. Energy-filtered imaging of the secondary electrons resulting in reduced chromatic aberrations as well as microspectroscopic identification of core and valence band electronic states have been successfully proven. We also find that the fast valence band electrons are not influenced by space charge effects, which is essentially important for attosecond nanoplasmonic-field microscopy realization.

Incoherent magnetization rotation observed in subnanosecond time-resolving x-ray photoemission electron microscopy

We present recent results of time-resolved x-ray photoemission electron microscopy on permalloy microstructures. The stroboscopic experiments feature a time-resolution of Δτ⩽130ps. We observe a strong influence of incoherent magnetization rotation processes, leading to a significant transient stray-field formation at the edges of the microstructure.

Microspectroscopy and spectromicroscopy with photoemission electron microscopy using a new kind of imaging energy filter

The use of an imaging retarding field analyser attached to the FOCUS IS-PEEM is described. This kind of energy filter is a simple, powerful tool to obtain microspectra from areas of down to about 1 μm using (V)UV and X-ray excitation sources. First results of microspectroscopy measured by excitation with a laboratory as well as a synchrotron X-ray source are presented.

Time-of-flight photoemission electron microscopy – a new way to chemical surface analysis

The time structure of synchrotron radiation at BESSY 1 (Berlin) was utilised to operate a photoemission electron microscope in the time-of-flight mode. The electrons that are emitted from the sample surface with different energies are dispersed in a drift tube subsequent to the imaging optics. Two ways of fast image detection have been explored, a fast gated intensified CCD camera (800 ps gate time) and a special counting electronics in combination with a 3D (x.y, t)-resolving delay line detector (time resolution < 500 ps). The latter device has a lateral resolution of about 50 μm in the image plane being equivalent to 1000 pixels along the image diagonal. An energy resolution of 400 meV has been achieved. The future potential of time-resolving photoemission microscopy is discussed.

Observation of Cu surface inhomogeneities by multiphoton photoemission spectromicroscopy

The spatially resolved energy distribution of electrons emitted from a polycrystalline copper surface has been studied by multiphoton photoemission. Electron emission was induced by femtosecond laser excitation and detected by an emission electron microscope combined with a time-of-flight detector to allow spatially resolved energy analysis. The energy distributions obtained from small spots with strongly enhanced electron emission yield (so-called hot spots) turned out to be different from those measured for homogeneous surface regions. The latter directly reflect two photon photoemission spectra from Cu as was previously observed in spatially averaging experiments. The hot spots, however, are characterized by a slightly lower work function and a strongly enhanced intensity if excited by s-polarized light. The peak positions of these spectra do not depend on the photon energy as is characteristic for a true secondary process. This indicates a different electron emission mechanism in the hot spots compare...

Anomalous d-like surface resonances on Mo(110) analyzed by time-of-flight momentum microscopy.

The electronic surface states on Mo(110) have been investigated using time-of-flight momentum microscopy with synchrotron radiation (hν=35 eV). This novel angle-resolved photoemission approach yields a simultaneous acquisition of the E-vs-k spectral function in the full surface Brillouin zone and several eV energy interval. (kx,ky,EB)-maps with 3.4 Å(-1) diameter reveal a rich structure of d-like surface resonances in the spin-orbit induced partial band gap. Calculations using the one-step model in its density matrix formulation predict an anomalous state with Dirac-like signature and Rashba spin texture crossing the bandgap at Γ¯ and EB=1.2 eV. The experiment shows that the linear dispersion persists away from the Γ¯-point in an extended energy- and k∥-range. Analogously to a similar state previously found on W(110) the dispersion is linear along H¯-Γ¯-H¯ and almost zero along N¯-Γ¯-N¯. The similarity is surprising since the spin-orbit interaction is 5 times smaller in Mo. A second point with unusual topology is found midway between Γ¯ and N¯. Band symmetries are probed by linear dichroism.

Direct 3D mapping of the Fermi surface and Fermi velocity

We performed a full mapping of the bulk electronic structure including the Fermi surface and Fermi-velocity distribution vF(kF) of tungsten. The 4D spectral function ρ(EB; k) in the entire bulk Brillouin zone and 6 eV binding-energy (EB) interval was acquired in ∼3 h thanks to a new multidimensional photoemission data-recording technique (combining full-field k-microscopy with time-of-flight parallel energy recording) and the high brilliance of the soft X-rays used. A direct comparison of bulk and surface spectral functions (taken at low photon energies) reveals a time-reversal-invariant surface state in a local bandgap in the (110)-projected bulk band structure. The surface state connects hole and electron pockets that would otherwise be separated by an indirect local bandgap. We confirmed its Dirac-like spin texture by spin-filtered momentum imaging. The measured 4D data array enables extraction of the 3D dispersion of all bands, all energy isosurfaces, electron velocities, hole or electron conductivity, effective mass and inner potential by simple algorithms without approximations. The high-Z bcc metals with large spin-orbit-induced bandgaps are discussed as candidates for topologically non-trivial surface states.

Actinic extreme ultraviolet lithography mask blank defect inspection by photoemission electron microscopy

A new method for the actinic inspection of defects inside and on top of extreme ultraviolet (EUV) lithography multilayer-coated mask blanks is presented. The experimental technique is based on photoemission electron microscopy supported by the generation of a standing wave field inside and above the multilayer mask blank when illuminated near the resonance Bragg wavelength at around 13.5nm. Experimental results on programed defect samples based on electron beam lithographic structures or silica balls overcoated with an EUV multilayer show that buried defects with a lateral size down to 50nm are detectable. Furthermore, phase structures as shallow as 6nm in height on a programed phase grating sample have been detected by this technique. The contrast of the phase defect structures has shown to be strongly dependent on and controlled by the phase of the standing wave field at the mask blank surface, and thus can be optimized by tuning the inspection wavelength.

Spin Polarimetry and Magnetic Dichroism on a Buried Magnetic Layer Using Hard X-ray Photoelectron Spectroscopy

The spin-resolved electronic structure of buried magnetic layers is studied by hard X-ray photoelectron spectroscopy (HAXPES) using a spin polarimeter in combination with a high-energy hemispherical electron analyzer at the high-brilliance BL47XU beamline (SPring-8, Japan). Spin-resolved photoelectron spectra are analyzed in comparison with the results of magnetic linear and circular dichroism in photoelectron emission in the case of buried Co2FeAl0.5Si0.5 layers. The relatively large inelastic mean free path (up to 20 nm) of fast photoelectrons enables us to extend the HAXPES technique with electron-spin polarimetry and to develop spin analysis techniques for buried magnetic multilayers and interfaces.