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Featured researches published by A. Polit.


Journal of Applied Physics | 2012

Chemical order and crystallographic texture of FePd:Cu thin alloy films

Marcin Perzanowski; Y. Zabila; Michal Krupinski; Arkadiusz Zarzycki; A. Polit; M. Marszałek

FePd thin films have been recently considered as promising materials for high-density magnetic storage devices. However, it is necessary to find a proper method of fabrication for the (001)-textured and chemically well-ordered alloy. In this paper, we present the detailed investigations of lattice parameters, chemical order degree, grain sizes, and crystallographic texture carried out on FePd alloys with 10 at.% of Cu addition. The initial [Cu(0.2 nm)/Fe(0.9 nm)/Pd(1.1 nm)]5 multilayers were thermally evaporated in an ultrahigh vacuum on MgO(100), Si(100), Si(111), and Si(100) covered by a 100-nm-thick layer of amorphous SiO2. In order to obtain a homogeneous FePd:Cu alloy, the multilayers were annealed in two different ways. First, the samples were rapidly annealed in nitrogen atmosphere at 600 °C for 90 seconds. Next, the long annealing in a high vacuum for 1 h at 700 °C was done. This paper focuses on quantitative investigations of the chemical order degree and crystallographic texture of ternary FePd:...


Journal of Applied Physics | 2011

X-ray absorption fine structure and x-ray diffraction studies of crystallographic grains in nanocrystalline FePd:Cu thin films

Michal Krupinski; Marcin Perzanowski; A. Polit; Y. Zabila; Arkadiusz Zarzycki; A. Dobrowolska; M. Marszałek

FePd alloys have recently attracted considerable attention as candidates for ultrahigh density magnetic storage media. In this paper we investigate FePd thin alloy film with a copper admixture composed of nanometer-sized grains. [Fe(0.9 nm)/Pd(1.1 nm)/Cu(d nm)]×5 multilayers were prepared by thermal deposition at room temperature in UHV conditions on Si(100) substrates covered by 100 nm SiO2. The thickness of the copper layer has been changed from 0 to 0.4 nm. After deposition, the multilayers were rapidly annealed at 600 °C in a nitrogen atmosphere, which resulted in the creation of the FePd:Cu alloy. The structure of alloy films obtained this way was determined by x-ray diffraction (XRD), glancing angle x-ray diffraction, and x-ray absorption fine structure (EXAFS). The measurements clearly showed that the L10 FePd:Cu nanocrystalline phase has been formed during the annealing process for all investigated copper compositions. This paper concentrates on the crystallographic grain features of FePd:Cu alloy...


Acta Physica Polonica A | 2009

Direct Laser Interference Patterning: Theory and Application

Y. Zabila; Marcin Perzanowski; A. Dobrowolska; M. Kąc; A. Polit; M. Marszałek


Acta Physica Polonica A | 2010

AFM, XRD and HRTEM Studies οf Annealed FePd Thin Films

Marcin Perzanowski; Y. Zabila; J. Morgiel; A. Polit; Michal Krupinski; A. Dobrowolska; M. Marszałek


Surface Science | 2007

The effect of surfactants on the growth of Co/Cu multilayers

M. Marszałek; A. Polit; Valeryi Tokman; Y. Zabila; Ivan Yu. Protsenko


Journal of Magnetism and Magnetic Materials | 2015

Structural and magnetic properties of Cu-alloyed FePd films

A. Polit; Denys Makarov; C. Brombacher; Michal Krupinski; Marcin Perzanowski; Y. Zabila; M. Albrecht; M. Marszałek


Nuclear Instruments & Methods in Physics Research Section B-beam Interactions With Materials and Atoms | 2009

Swift iodine ion modification of the structural and magnetotransport properties of Fe/Cr systems

M. Kąc; J. Żukrowski; M. Toulemonde; R. Kruk; V. Tokman; A. Polit; Y. Zabila; A. Dobrowolska; O. V. Synashenko; M. Marszałek


Thin Solid Films | 2013

Surfactant influence on interface roughness and magnetoresistance value in Fe/Cr multilayers

M. Kąc; A. Polit; A. Dobrowolska; Y. Zabila; Michal Krupinski; M. Marszałek


Applied Surface Science | 2014

Atomic scale structure investigations of epitaxial Fe/Cr multilayers

M. Kąc; J. Morgiel; A. Polit; Y. Zabila; M. Marszałek


Acta Physica Polonica A | 2010

AES Studies of Saturation in Surfactant Segregation Process in Co/Cu Multilayers

Michal Krupinski; A. Dobrowolska; M. Kąc; A. Polit; Y. Zabila; M. Marszałek

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M. Marszałek

Polish Academy of Sciences

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Y. Zabila

Polish Academy of Sciences

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M. Kąc

Polish Academy of Sciences

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A. Dobrowolska

Polish Academy of Sciences

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Michal Krupinski

Polish Academy of Sciences

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Cz. Kapusta

AGH University of Science and Technology

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D. Zając

AGH University of Science and Technology

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Konstanty Marszałek

AGH University of Science and Technology

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