A. S. Bogolubov

Microstrip Photonic Crystals and their Application for Measurement Parameters of Materials

The computer simulation and experimental investigation of frequency dependencies of the reflectance and the transmittance of photonic crystals based on the microstrip structures in the frequency band 0-20 GHz have been performed. The investigations were performed for the photonic crystal with irregularity introduced as changed geometry size of the stripline conductor or changed substrate permittivity of one of the sequence microstrip sections. Good quantitative fit between the calculations and experimental results have been obtained. The possibility of application of open microwave transmission lines - microstrip photonic crystals - for measurement parameters of a material which acts as irregularity in the photonic crystal has been demonstrated.

Wideband waveguide loading impedance matching on the basis of photonic crystals with nanometer metal layers

Theoretically shown and experimentally proven is the possibility of creating wideband matched loading on the basis of photonic crystals, composed of alternating nanometer metal and isolator layers with different electro-physical parameters.

Wideband Waveguide Matched Loads Based on Photonic Crystals with Nanometer Metal Layers

The possibility of creation of wideband matched loads based on waveguide photonic crystals consisted of alternating layers of dielectrics with different values of thickness and permittivity and nanometer-thin metals with different values of thickness and conductivity has been shown theoretically and proven experimentally.

Application of microstrip photonic crystals for measurement of electrophysical parametres of ethanol/water mixtures

The change of real and imaginary parts of the complex permittivity of ethanol/water mixture at temperature change had been investigated.

Wideband matched loads based on waveguide photonic structures with nanometer metal layers

The possibility of creation of wideband matched loads based on waveguide photonic structures consisted of alternating layers of dielectrics and nanometer-thin metals with different values of electrophysical parameters has been shown theoretically and proven experimentally.

Computer microwave diagnostic system for measurement of parameters of sandwich-like micro- and nano-structures

The Computer Diagnostic System for measurement of parameters of sandwich-like metal-dielectric and metal-semiconductor micro- and nano-structures from the reflection and transmission microwave spectra, developed in Saratov State University, is presented.

Application of microstrip photonic crystals to measurement of parameters of materials

Computer simulation and experimental investigation of transmission spectra of microstrip photonic crystals have been performed in the frequency band from 0 till 6 GHz. Good coincidence of the calculation results with experiment has been obtained. The possibility to use the microstrip photonic crystals for implementation of the method of measurement of parameters of materials has been shown.

Measurement of Nanometer Metal Layers using Waveguide Photonic Structures

The possibility of using waveguide photonic structures for measuring parameters of nanometer metal layers on dielectric structures has been investigated.

Microwave Method for Measuring Conductivity of Nanometer Metal Films in Multilayer Structures

The method for measuring conductivity of nanometer metal films in multilayer structures in thicknesses range from units till thousands nanometers from electromagnetic wave reflectance spectra is presented