A. Tengattini

Erbium emission in MOS light emitting devices: From energy transfer to direct impact excitation

The electroluminescence (EL) at 1.54 μm of metal–oxide–semiconductor (MOS) devices withEr3C ions embedded in the silicon-rich silicon oxide (SRSO) layer has been investigated under different polarization conditions and compared with that of erbium doped SiO2 layers. EL time-resolved measurements allowed us to distinguish between two different excitation mechanisms responsible for the Er3C emission under an alternate pulsed voltage signal (APV). Energy transfer from silicon nanoclusters (Si-ncs) to Er3C is clearly observed at low-field APV excitation. We demonstrate that sequential electron and hole injection at the edges of the pulses creates excited states in Si-ncs which upon recombination transfer their energy to Er3C ions. On the contrary, direct impact excitation of Er3C by hot injected carriers starts at the Fowler–Nordheim injection threshold (above 5 MV cm(-1)) and dominates for high-field APV excitation.

Toward a 1.54

In this paper, we report on the first attempt to design, fabricate, and test an on-chip optical amplifier which works at 1540 nm and can be electrically driven. It is based on an asymmetric silicon slot waveguide which embeds the active material. This is based on erbium-doped silicon rich silicon oxide. We describe the horizontal asymmetric slot waveguide design which allows us to get a high field confinement in a nanometer thick active layer. In addition, we detail the complex process needed to fabricate the structure. The waveguides have been characterized both electrically as well as optically. Electroluminescence can be excited by hot carrier injection, due to impact excitation of the Er ions. Propagation losses have been measured and high values have been found due to processing defects. Pump and probe measurements show a voltage dependent strong attenuation of the probe signal due to free carrier accumulation and absorption in the slot waveguide region. At the maximum electrical pumping level, electroluminescence signal is in the range of tens of μW/cm 2 and the overall loss of the device is only -6 dB. Despite not demonstrating optical amplification, this study shines some light on the path to achieve an all-silicon electrically driven optical amplifier.

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Silicon nanocrystals have shown attractive properties for photonic and photovoltaic applications. We demonstrate all-Si light-emitting diodes based on boron-doped Si nanocrystal/c-Si p-n heterojunction structure, which show electroluminescence in the visible/infrared regions. The electroluminescencespectra of these diodes can be modified by changing the quantum confining barriers from SiO2 to Si3N4. Our results are an important demonstration of electroluminescence from boron-doped Si nanocrystals—a wide band gap absorber material for third generation photovoltaics.

m Electrically Driven Erbium-Doped Silicon Slot Waveguide and Optical Amplifier

We have fabricated a series of thin (~50 nm) erbium-doped (by ion implantation) silicon-rich oxide films in the configuration that mitigates previously proposed mechanisms for loss of light emission capability of erbium ions. By combining the methods of optical, structural and electrical analysis, we identify the erbium ion clustering as a driving mechanism to low optical performance of this material. Experimental findings in this work clearly evidence inadequacy of the commonly employed optimization procedure when optical amplification is considered. We reveal that the significantly lower erbium ion concentrations are to be used in order to fully exploit the potential of this approach and achieve net optical gain.

Electroluminescence from Si nanocrystal/c-Si heterojunction light-emitting diodes

High quantum efficiency erbium doped silicon nanocluster (Si-NC:Er) light emitting diodes (LEDs) were grown by low-pressure chemical vapor deposition (LPCVD) in a complementary metal-oxide-semiconductor (CMOS) line. Erbium (Er) excitation mechanisms under direct current (DC) and bipolar pulsed electrical injection were studied in a broad range of excitation voltages and frequencies. Under DC excitation, Fowler-Nordheim tunneling of electrons is mediated by Er-related trap states and electroluminescence originates from impact excitation of Er ions. When the bipolar pulsed electrical injection is used, the electron transport and Er excitation mechanism change. Sequential injection of electrons and holes into silicon nanoclusters takes place and nonradiative energy transfer to Er ions is observed. This mechanism occurs in a range of lower driving voltages than those observed in DC and injection frequencies higher than the Er emission rate.

Limit to the erbium ions emission in silicon-rich oxide films by erbium ion clustering

We studied the effect of rapid thermal processing and furnace annealing on the transport properties and electroluminescence (EL) of SiO2 layers doped with Si and Er ions. The results show that for the same annealing temperature, furnace annealing decreases the electrical conductivity and increases the probability of impact excitation, which leads to an improved external quantum efficiency. Correlations between predictions from phenomenological transport models, annealing regimes and erbium EL are observed and discussed. (Some figures may appear in colour only in the online journal)

Bipolar pulsed excitation of erbium-doped nanosilicon light emitting diodes

Electrically driven Er(3+) doped Si slot waveguides emitting at 1530 nm are demonstrated. Two different Er(3+) doped active layers were fabricated in the slot region: a pure SiO(2) and a Si-rich oxide. Pulsed polarization driving of the waveguides was used to characterize the time response of the electroluminescence (EL) and of the signal probe transmission in 1 mm long waveguides. Injected carrier absorption losses modulate the EL signal and, since the carrier lifetime is much smaller than that of Er(3+) ions, a sharp EL peak was observed when the polarization was switched off. A time-resolved electrical pump & probe measurement in combination with lock-in amplifier techniques allowed to quantify the injected carrier absorption losses. We found an extinction ratio of 6 dB, passive propagation losses of about 4 dB/mm, and a spectral bandwidth > 25 nm at an effective d.c. power consumption of 120 μW. All these performances suggest the usage of these devices as electro-optical modulators.

Effect of the annealing treatments on the electroluminescence efficiency of SiO 2 layers doped with Si and Er

Infrared photoconductive and photovoltaic effects are observed in Er-doped Si nanoclusters incorporated in a silicon p-i-n slot-waveguide device. These effects are ascribed to deep gap states of Si nanoclusters. The room temperature open circuit voltage of the devices is 290 mV under transmission of guided light at 1.5 μm. A power dependence, with the exponent close to 0.5 and 1 for forward and reverse bias, respectively, has been observed for the photocurrent versus light intensity characteristic. The former is attributed to bimolecular recombination (empty deep gap states) and the latter to linear recombination with the states being populated with electrons.

Electrical pump & probe and injected carrier losses quantification in Er doped Si slot waveguides.

In this work, the optoelectronic properties of silicon light emitting field-effect transistors (LEFETs) have been investigated. The devices have been fabricated with silicon nanocrystals in the gate oxide and a semitransparent polycrystalline silicon gate. We compare the properties of LEFET with a more conventional MOS-LED (two-terminal light-emitting capacitor) with the same active material. The ~45 nm thick gate siliconrich oxide is deposited in a size-controlled multilayer geometry by low pressure chemical vapor deposition using standard microelectronic processes in a CMOS line. The multilayer stack is formed by layers of silicon oxide and silicon rich silicon oxide. The nanocrystal size and the tunneling barrier width are controlled by the thickness of silicon-rich silicon oxide and stochiometric silicon oxide layers, respectively. The silicon nanocrystals have been characterized by means of spectrally and time resolved photoluminescence, high resolution TEM, and x-ray photoelectron spectroscopy. Resistivity of the devices, capacitance, and electroluminescence under direct and pulsed injection current scheme have been studied and here reported. The optical power density and the external quantum efficiency of the LEFETs will be compared with the MOSLED results. This study will help to develop practical optoelectronic and photonic devices via accurate modeling and engineering of charge transport and exciton recombination in silicon nanocrystal arrays.

Infrared photoconductivity of Er-doped Si nanoclusters embedded in a slot waveguide

Optoelectronic properties of Er3+-doped slot waveguides electrically driven are presented. The active waveguides have been coupled to a Si photonic circuit for the on-chip distribution of the electroluminescence (EL) signal at 1.54 μm. The Si photonic circuit was composed by an adiabatic taper, a bus waveguide and a grating coupler for vertical light extraction. The EL intensity at 1.54 μm was detected and successfully guided throughout the Si photonic circuit. Different waveguide lengths were studied, finding no dependence between the waveguide length and the EL signal due to the high propagation losses measured. In addition, carrier injection losses have been observed and quantified by means of time-resolved measurements, obtaining variable optical attenuation of the probe signal as a function of the applied voltage in the waveguide electrodes. An electro-optical modulator could be envisaged if taking advantage of the carrier recombination time, as it is much faster than the Er emission lifetime.