A. V. Chzhan
Russian Academy of Sciences
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Featured researches published by A. V. Chzhan.
Physics of Metals and Metallography | 2010
A. V. Chzhan; G. S. Patrin; S. Ya. Kiparisov; V. A. Seredkin; M. G. Pal’chik
The main features of the formation of chemically deposited thin polycrystalline Co-P films of nanometer thickness have been determined experimentally. Changes in the surface structure of films with different thicknesses have been determined using an atomic force microscope. It has been established that at thicknesses smaller than 10 nm the films represent a set of weakly connected nuclei of crystallites with random orientations of easy axes. The subsequent increase in the thickness of films leads to the formation of a uniform polycrystalline layer. Estimates are given, which make it possible to determine the magnetic state of crystallites for the case of their weak magnetic interaction.
Bulletin of The Russian Academy of Sciences: Physics | 2016
A. V. Chzhan; T. N. Patrusheva; S. A. Podorozhnyak; V. A. Seredkin; G. N. Bondarenko
The effect alkali reagents have on the crystal structure of CoP films prepared via chemical deposition is investigated. It is shown that the use of sodium hydrogen carbonate and ammonium hydroxide in low concentrations leads to growth of the hexagonal phase in the films. As the concentration of alkali reagents is increased, the formation of a cubic or amorphous phase is observed.
Bulletin of The Russian Academy of Sciences: Physics | 2011
A. V. Chzhan; G. S. Patrin; V. A. Seredkin; S. Ya. Kiparisov; L. V. Burkova
The results from experimental studies of the magnetooptical Kerr and Faraday effects in Co-P films are described. It is shown that the angle of rotation of the polarization of light in the polar Kerr effect is a nonmonotonic function of film thickness. Maximum changes in the angle of rotation are observed in the wavelength region of incident radiation for thicknesses comparable to the skin layer. A qualitative model in which the observed effects are attributed to the multilayer structure of the samples under study is described.
Bulletin of The Russian Academy of Sciences: Physics | 2009
A. V. Chzhan; S. Ya. Kiparisov; V. A. Seredkin; G. S. Patrin; M. G. Pal’chik
The magnetic properties of a film trilayer consisting of hard magnetic and soft magnetic Co-P layers separated by a nonmagnetic Ni-P spacer have been studied. The features of the hysteresis shift relative to the zero exchange magnetic field and of the coercivity of the soft magnetic layer in the dependence on thicknesses of the hard magnetic layer and spacer have been considered. The dynamic changes in the shift of the hysteresis of the soft magnetic layer versus the magnetization reversal time after saturation of the hard magnetic layer have been found and investigated.
Bulletin of The Russian Academy of Sciences: Physics | 2016
L. V. Burkova; A. V. Chzhan; A. E. Sokolov; N. N. Kosyrev; K. V. Tabakaeva; G. S. Patrin
Features of the optical and magneto-optical properties of polycrystalline Со–Р films with nanometer thickness are established experimentally. It is found that the spectra of optical parameters n and k and magnetic circular dichroism depend largely on film thickness, suggesting that magneto-optical activity is governed by different mechanisms in thin films and bulk materials.
Solid State Phenomena | 2015
A. V. Chzhan; V. A. Seredkin; G. S. Patrin; Vladimir N. Zabluda; Yan V. Zubavichus; Yu. L. Mikhlin; R. Yu. Rudenko
Amorphous Со-Р and Co-Ni-P films fabricated by chemical deposition under the same conditions are investigated. It is demonstrated that the phosphorous content in the Co-Ni-P exceeds that in the Со-Р films by 1.5−2%. The atomic force microscopy analysis of the surface morphology shows that incorporation of Ni atoms in the Со−Р alloy leads to coarsening of grains due to the higher rate of deposition of Ni atoms as compared with the rate of deposition of Со atoms. The reduction of the dispersion of the polar Kerr effect saturation field in the Со-Ni-P films is attributed to ordering of Сo-Ni atomic pairs.
Solid State Phenomena | 2014
A. V. Chzhan; Semen Y. Kiparisov; Gennagy S. Patrin
Coercivity of amorphous Co-P single-layer and trilayer films fabricated by chemical deposition has been investigated. It has been established that the thickness dependences of the coercivity for isotropic and anisotropic films are different. Data on the coercivity variation with a nonmagnetic spacer thickness and a number of magnetic layers in the trilayer films are reported. The results obtained are analyzed with regard to the features of the induced anisotropy in amorphous ferromagnetic films and the magnetic coupling between magnetic layers in sandwich structures.
Bulletin of The Russian Academy of Sciences: Physics | 2013
A. V. Chzhan; V. A. Seredkin; S. Ya. Kiparisov; G. S. Patrin
The results from experimental investigations on the dependences of the displacement field of hysteresis loop HE and the saturation field of the polar Kerr effect HS on the thickness of nonmagnetic interlayers in three-layer films obtained by chemical deposition are presented. Possible mechanisms responsible for oscillating variations in HS at interlayer thicknesses are presented.
Solid State Phenomena | 2012
A. V. Chzhan; G. S. Patrin; S. Ya. Kiparisov; V. A. Seredkin
Exchange bias and coercivity of the hysteresis loop of a low-coercive layer in magnetic three-layered structure prepared by chemical deposition are studied. It is established that the coercive force in the films obtained nonmonotonically changed with the low-coercive layer thickness. The specificity of magnetization reversal of exchange-biased layers is analyzed.
Bulletin of The Russian Academy of Sciences: Physics | 2012
A. V. Chzhan; G. S. Patrin; S. Ya. Kiparisov; V. A. Seredkin; M. G. Pal’chik; L. V. Burkova
Features of the formation of chemically deposited polycrystalline Co-P films with nanometer thicknesses are established by magnetic measurements and analysis of film surface morphology. It is found that the specific value of the magnetooptical Faraday effect in Co-P films exceeds that in Co films by a factor of more than two. This is attributed to the magnetic polarization of a Pd underlayer. It is shown the Kerr effect in Co films is negligibly influenced by the embedding of phosphorus.