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A. V. Zablotskii

Moscow Institute of Physics and Technology

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Publication

Featured researches published by A. V. Zablotskii.

Measurement Techniques | 2013

Components of secondary x-ray spectrum in polychromatic excitation and energy-dispersive detection

A. V. Zablotskii; A. A. Viryus; O. I. Lyamina; A. Yu. Kuzin; T. A. Kupriyanova; P. A. Todua; M. N. Filippov

Measurement Techniques | 2013

An X-ray Fluorescence Determination of Platinum and Rhodium in Autocatalysts on a Ceramic Base

Yu. V. Antonova; A. V. Zablotskii; O. I. Lyamina; Yu. A. Karpov; A. Yu. Kuzin; T. A. Kupriyanova; M. N. Filippov

Measurement Techniques | 2016

MEASUREMENT OF STRUCTURAL PARAMETERS BASED ON X-RAY EMISSION SPECTRA WITH ENERGY-DISPERSIVE DETECTION

V. P. Gavrilenko; A. V. Zablotskii; S. A. Korneichuk; A. Yu. Kuzin; T. A. Kupriyanova; O. I. Lyamina; P. A. Todua; M. N. Filippov; V. Ya. Shklover

Measurement Techniques | 2014

An Estimate of the Uncertainty of Measurements of Lattice Spacings in Silicon Single Crystals Using a Laboratory x-Ray Diffractometer

V. P. Gavrilenko; M. A. Ermakova; A. V. Zablotskii; A. Yu. Kuzin; P. A. Todua; M. N. Filippov

Archive | 2013

THE CALCULATION OF MATRIX EFFECTS IN MEASUREMENTS BY THE X-RAY SPECTRUM MICROANALYSIS METHOD PHYSICOCHEMICAL MEASUREMENTS

A. V. Zablotskii; A. Yu . Kuzin; N. N. Mikheev; M. A. Stepovich; P. A. Todua; E. V. Shirokova; M. N. Filippov

Measurement Techniques | 2013

Calibration stability of scanning electron microscopes

A. V. Zablotskii; V. V. Al’zoba; S. A. Morozov; P. A. Todua

Measurement Techniques | 2013

A Method of Estimating the Stability of the Scale Factor of a Transmission Electron Microscope

A. V. Zablotskii; A. S. Avilov; D. S. Bodunov; A. A. Kuzin; A. Yu. Kuzin; A. A. Kuz’min; P. A. Todua

Measurement Techniques | 2013

The Calculation of Matrix Effects in Measurements by the X-Ray Spectrum Microanalysis Method

A. V. Zablotskii; A. Yu. Kuzin; N. N. Mikheev; M. A. Stepovich; P. A. Todua; E. V. Shirokova; M. N. Filippov

Measurement Techniques | 2013

Determination of the nonlinearity of capacitive sensors along the Z-axis of an atomic force microscope

A. V. Zablotskii; V. A. Sharonov; V. S. Bormashov; A. S. Baturin; P. A. Todua

Measurement Techniques | 2013

Standard sample for calibration of transmission electron microscopes nanometrology

D. S. Bodunov; V. P. Gavrilenko; A. V. Zablotskii; A. A. Kuzin; A. Yu. Kuzin; V. B. Mityukhlyaev; A. V. Rakov; P. A. Todua; M. N. Filippov

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P. A. Todua

Moscow Institute of Physics and Technology

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M. N. Filippov

Russian Academy of Sciences

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A. Yu. Kuzin

United Kingdom Ministry of Defence

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V. P. Gavrilenko

Moscow Institute of Physics and Technology

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A. A. Kuzin

Moscow Institute of Physics and Technology

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O. I. Lyamina

Russian Academy of Sciences

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T. A. Kupriyanova

Russian Academy of Sciences

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A. A. Kuz’min

Moscow Institute of Physics and Technology

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A. V. Rakov

Russian Academy of Sciences

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M. A. Ermakova

Moscow Institute of Physics and Technology

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