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Featured researches published by A.W. Willemse.


Powder Technology | 1996

Possibilities of near backward light scattering for characterizing dense particle systems

Camiel Heffels; A.W. Willemse; B. Scarlett

Abstract A backscattering probe has been tested as an alternative to the more common forward light scattering technique for particle size determination. The backscattering signature of an ensemble of spherical particles in front of the probe window was measured with a charged coupled device (CCD) camera and compared with Lorenz-Mie calculations. The fringe structure allows the measurement of particle size. However, the width of the size distribution must be small to observed the fringes. The phenomenon of enhanced backscattering in concentrated random particle media is investigated and discussed. The width of the coherent backscatter peak, due to multiple scattering serves as an indicator for the mean particle size, independent of the shape of the particles. The total amount of backscattered light is an indication of the total reflecting surface area of the sample.


Journal of Aerosol Science | 1996

Photon correlation spectroscopy for analysis of low concentration submicrometer samples

A.W. Willemse; J.C.M. Marijnissen; Rein Andre Roos; A.L. van Wuyckhuyse; B. Scarlett

Photon Correlation Spectroscopy is a technique to rapidly measure particle size in the submicrometer region. The use of PCS is, however, limited by concentration. The upper limit is due to multiple scattering of the incident light, the lower limit is determined by the fact that fluctuations of the number of particles in the measuring zone have a significant influence on the apparent diffusion coefficient. In this article a new signal processing method is described which differentiates this influence. With this system the lower limit is no longer limited to about 100 particles in the measuring volume corresponding to a concentration of 109 particles/cm3. The limitation is now the intensity of the scattered light which becomes too weak at a concentration of about 50 particles/cm3. As a consequence of this work, a revision to the basic theory of PCS may be necessary. Moreover, the new processing method enables also the measurement of particle concentration in the sample.


Particle & Particle Systems Characterization | 1999

Monitoring the Dynamics of Concentrated Suspensions by Enhanced Backward Light Scattering

Patrick T. Spicer; Sotiris E. Pratsinis; A.W. Willemse; Henk G. Merkus; B. Scarlett


Journal of Aerosol Science | 1996

Determination of on-line particle size and concentration for sub-micron particles at low concentrations

A.L. van Wuyckhuyse; A.W. Willemse; J.C.M. Marijnissen; B. Scarlett


Journal of Colloid and Interface Science | 1998

Development of a heterodyne photon correlation spectroscopy measuring probe for highly concentrated dispersions

A.W. Willemse; Henk G. Merkus; B. Scarlett


Particle & Particle Systems Characterization | 1997

Low-Concentration Photon Correlation Spectroscopy

A.W. Willemse; J.C.M. Marijnissen; Arjan L. van Wuyckhuyse; Rein Andre Roos; Henk G. Merkus; B. Scarlett


WO 9713139 (A1) | 1997

Method and apparatus for measuring particle size at low concentration

J.C.M. Marijnissen; A.W. Willemse; Rein Andre Roos


Journal of Aerosol Science | 1998

Photon correlation spectroscopy for analysis of particle size and concentration of low concentration aerosols

E.J. Nijman; A.W. Willemse; K.B. Geerse; J.C.M. Marijnissen; B. Scarlett


Journal of Aerosol Science | 1995

Photon correlation spectroscopy for analysis of low concentration aerosols

A.W. Willemse; Michiel A van Drunen; I.L. Tuinman; Jan C.M Marijnisse; Henk G. Merkus; B. Scarlett


Archive | 2002

Fremgangsmåde og apparat til måling af partikelstørrelse ved lave koncentrationer

Johannes Cornelis Maria Marijn; A.W. Willemse; Rein Andre Roos

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J.C.M. Marijnissen

Delft University of Technology

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Henk G. Merkus

Delft University of Technology

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Rein Andre Roos

Delft University of Technology

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A.L. van Wuyckhuyse

Delft University of Technology

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E.J. Nijman

Delft University of Technology

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Camiel Heffels

Delft University of Technology

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I.L. Tuinman

Delft University of Technology

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K.B. Geerse

Delft University of Technology

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Michiel A van Drunen

Delft University of Technology

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