Aaron Kobler

Combination of in situ straining and ACOM TEM: a novel method for analysis of plastic deformation of nanocrystalline metals.

Nanocrystalline metals are expected to exhibit different deformation mechanisms when compared to their coarse grained counterparts because the dislocation storage capacity decreases and the grain boundary mediated processes become more pronounced with decreasing grain size. As a new approach to directly image and quantify the plastic deformation processes in nanocrystalline thin films, a combination of automated crystal orientation mapping in microprobe STEM mode with in situ straining inside a TEM was developed. ACOM-TEM closes the gap between EBSD and BF/DFTEM by providing full orientation maps with nanometer resolution. The novel combination with in situ straining provided for the first time the possibility to directly image and quantify the structural changes of all crystallites in the ensemble of a thin film at the nanometer scale during mechanical deformation. It was used to characterize the metallographic changes during tensile deformation of a nanocrystalline Au thin film prepared by magnetron sputtering. The investigation of the grain size, grain orientation and twinning on a global (grain average over a micron sized area) and local (assembly of selected grains) scale allowed for the development of an in depth picture of the deformation processes. Grain boundary motion and local grain rotation were two of the processes acting to dissipate the applied stress. Additionally, twinning/detwinning occurred simultaneously during straining. These processes, which occurred locally already in the micro-plastic regime, led to global grain growth starting at the transition to the macro-plastic deformation regime.

Deformation-induced grain growth and twinning in nanocrystalline palladium thin films

Summary The microstructure and mechanical properties of nanocrystalline Pd films prepared by magnetron sputtering have been investigated as a function of strain. The films were deposited onto polyimide substrates and tested in tensile mode. In order to follow the deformation processes in the material, several samples were strained to defined straining states, up to a maximum engineering strain of 10%, and prepared for post-mortem analysis. The nanocrystalline structure was investigated by quantitative automated crystal orientation mapping (ACOM) in a transmission electron microscope (TEM), identifying grain growth and twinning/detwinning resulting from dislocation activity as two of the mechanisms contributing to the macroscopic deformation. Depending on the initial twin density, the samples behaved differently. For low initial twin densities, an increasing twin density was found during straining. On the other hand, starting from a higher twin density, the twins were depleted with increasing strain. The findings from ACOM-TEM were confirmed by results from molecular dynamics (MD) simulations and from conventional and in-situ synchrotron X-ray diffraction (CXRD, SXRD) experiments.

Plasticity mechanisms in ultrafine grained freestanding aluminum thin films revealed by in-situ transmission electron microscopy nanomechanical testing

In-situ bright field transmission electron microscopy (TEM) nanomechanical tensile testing and in-situ automated crystallographic orientation mapping in TEM were combined to unravel the elementary mechanisms controlling the plasticity of ultrafine grained Aluminum freestanding thin films. The characterizations demonstrate that deformation proceeds with a transition from grain rotation to intragranular dislocation glide and starvation plasticity mechanism at about 1% deformation. The grain rotation is not affected by the character of the grain boundaries. No grain growth or twinning is detected.

Orientation dependent fracture behavior of nanotwinned copper

Columnar grown nanotwinned Cu was tensile tested in-situ inside the TEM in combination with automated crystal orientation mapping scanning transmission electron microscopy to investigate the active deformation mechanisms present in this material. Two tensile directions were applied, one parallel to the twin boundaries and the other perpendicular to the twin boundaries. In case of tensile testing perpendicular to the twin boundaries, the material deformed by detwinning and the formation of new grains, whereas in the parallel case, no new grains were formed and the fracture happened along the twin boundaries and a boundary that has formed during the deformation.

The effect of solute segregation on strain localization in nanocrystalline thin films: Dislocation glide vs. grain-boundary mediated plasticity

Deformation mechanisms of nanocrystalline Au and AuCu thin films on compliant substrates were investigated by synchrotron-based in situ tensile testing and Automated Crystal Orientation Mapping using transmission electron microscopy. The results demonstrate that intragranular dislocation plasticity, inferred from evolution of deformation texture, is responsible for the formation of periodic and ordered shear bands in AuCu films. In contrast, pure Au films deform homogeneously without shear band formation and without evolution of deformation texture. Cu solutes are deemed to pin grain boundaries thereby enforce dislocation glide, while in pure Au, plasticity is carried by grain boundary shear and grain boundary migration.

In situ observation of deformation processes in nanocrystalline face-centered cubic metals

Summary The atomistic mechanisms active during plastic deformation of nanocrystalline metals are still a subject of controversy. The recently developed approach of combining automated crystal orientation mapping (ACOM) and in situ straining inside a transmission electron microscope was applied to study the deformation of nanocrystalline PdxAu1− x thin films. This combination enables direct imaging of simultaneously occurring plastic deformation processes in one experiment, such as grain boundary motion, twin activity and grain rotation. Large-angle grain rotations with ≈39° and ≈60° occur and can be related to twin formation, twin migration and twin–twin interaction as a result of partial dislocation activity. Furthermore, plastic deformation in nanocrystalline thin films was found to be partially reversible upon rupture of the film. In conclusion, conventional deformation mechanisms are still active in nanocrystalline metals but with different weighting as compared with conventional materials with coarser grains.

Structural study of growth, orientation and defects characteristics in the functional microelectromechanical system material aluminium nitride

The real structure and morphology of piezoelectric aluminum nitride (AlN) thin films as essential components of magnetoelectric sensors are investigated via advanced transmission electron microscopy methods. State of the art electron diffraction techniques, including precession electron diffraction and automated crystal orientation mapping (ACOM), indicate a columnar growth of the AlN grains optimized for piezoelectric application with a {0 0 0 1} texture. Comparing ACOM with piezoresponse force microscopy measurements, a visual correlation of the structure and the piezoelectric properties is enabled. With a quantitative analysis of the ACOM measurements, a statistical evaluation of grain rotations is performed, indicating the presence of coincidence site lattices with Σ7, Σ13a, Σ13b, Σ25. Using a geometric phase analysis on high resolution micrographs, the occurrence of strain is detected almost exclusively at the grain boundaries. Moreover, high resolution imaging was applied for solving the atomic stru...

Comprehensive analysis of TEM methods for LiFePO4/FePO4 phase mapping: spectroscopic techniques (EFTEM, STEM-EELS) and STEM diffraction techniques (ACOM-TEM)

Transmission electron microscopy (TEM) has been used intensively in investigating battery materials, e.g. to obtain phase maps of partially (dis)charged (lithium) iron phosphate (LFP/FP), which is one of the most promising cathode material for next generation lithium ion (Li-ion) batteries. Due to the weak interaction between Li atoms and fast electrons, mapping of the Li distribution is not straightforward. In this work, we revisited the issue of TEM measurements of Li distribution maps for LFP/FP. Different TEM techniques, including spectroscopic techniques (energy filtered (EF)TEM in the energy range from low-loss to core-loss) and a STEM diffraction technique (automated crystal orientation mapping (ACOM)), were applied to map the lithiation of the same location in the same sample. This enabled a direct comparison of the results. The maps obtained by all methods showed excellent agreement with each other. Because of the strong difference in the imaging mechanisms, it proves the reliability of both the spectroscopic and STEM diffraction phase mapping. A comprehensive comparison of all methods is given in terms of information content, dose level, acquisition time and signal quality. The latter three are crucial for the design of in-situ experiments with beam sensitive Li-ion battery materials. Furthermore, we demonstrated the power of STEM diffraction (ACOM-STEM) providing additional crystallographic information, which can be analyzed to gain a deeper understanding of the LFP/FP interface properties such as statistical information on phase boundary orientation and misorientation between domains.

Self-organization of mesoscopic silver wires by electrochemical deposition

Summary Long, straight mesoscale silver wires have been fabricated from AgNO3 electrolyte via electrodeposition without the help of templates, additives, and surfactants. Although the wire growth speed is very fast due to growth under non-equilibrium conditions, the wire morphology is regular and uniform in diameter. Structural studies reveal that the wires are single-crystalline, with the [112] direction as the growth direction. A possible growth mechanism is suggested. Auger depth profile measurements show that the wires are stable against oxidation under ambient conditions. This unique system provides a convenient way for the study of self-organization in electrochemical environments as well as for the fabrication of highly-ordered, single-crystalline metal nanowires.

Low temperature structural stability of Fe90Sc10 nanoglasses

ABSTRACT The structural stability of Fe90Sc10 nanoglasses has been studied by means of low temperature crystallization. Specimens were annealed in situ in a transmission electron microscope, and ex situ in an ultra-high vacuum tube-furnace. Both studies led to similar results. The structure of the Fe90Sc10 nanoglasses was stable for up to 2 h when annealed at 150°C. Annealing the Fe90Sc10 nanoglasses at higher temperature resulted in the formation of the nanocrystalline bcc-Fe(Sc). Impact statement The structural evolution of Fe90Sc10 nanoglasses has been studied in detail during low temperature annealing. Our results indicate that the nanostructure of Fe90Sc10 nanoglasses is quite stable at low temperature. GRAPHICAL ABSTRACT