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Dive into the research topics where Adam J. Nolte is active.

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Featured researches published by Adam J. Nolte.


Advanced Materials | 2011

Surface Wrinkling: A Versatile Platform for Measuring Thin‐Film Properties

Jun Young Chung; Adam J. Nolte; Christopher M. Stafford

Surface instabilities in soft matter have been the subject of increasingly innovative research aimed at better understanding the physics of their formation and their utility in patterning, organizing, and measuring materials properties on the micro and nanoscale. The focus of this Review is on a type of instability pattern known as surface wrinkling, covering the general concepts of this phenomenon and several recent applications involving the measurement of thin-film properties. The ability of surface wrinkling to yield new insights into particularly challenging materials systems such as ultrathin films, polymer brushes, polyelectrolyte multilayer assemblies, ultrasoft materials, and nanoscale structured materials is highlighted. A perspective on the future directions of this maturing field, including the prospects for advanced thin-film metrology methods, facile surface patterning, and the control of topology-sensitive phenomena, such as wetting and adhesion, is also presented.


Nano Letters | 2012

Avoiding Cracks in Nanoparticle Films

Jacob H. Prosser; Teresa Brugarolas; Steven Lee; Adam J. Nolte; Daeyeon Lee

A new method utilizing subsequent depositions of thin crack-free nanoparticle layers is demonstrated to avoid the formation of cracks within silica nanoparticle films. Using this method, films can be assembled with thicknesses exceeding the critical cracking values. Explanation of this observed phenomenon is hypothesized to mainly arise from chemical bond formation between neighboring silica nanoparticles. Application of this method for fabricating crack-free functional structures is demonstrated by producing crack-free Bragg reflectors that exhibit structural color.


ACS Applied Materials & Interfaces | 2012

One-step index-tunable antireflection coatings from aggregated silica nanoparticles.

Kevin T. Cook; Kwadwo E. Tettey; Robert M. Bunch; Daeyeon Lee; Adam J. Nolte

We demonstrate a method for producing thickness- and refractive index-tunable antireflection coatings utilizing a one-step spin coating procedure with silica nanoparticle solutions. Aging nanoparticle solutions under controlled pH and temperature induces aggregation, allowing precise control of the porosity and refractive index of the spin-processed coating. Coating thickness measurements as a function of solution aging time and temperature allow for determination of the activation energy of the reaction-limited aggregation process. We demonstrate optimization of the antireflection effect for a single-layer silica nanoparticle coating on glass, and suggest that the aggregation method may be generalized to various other nanoparticle-based assemblies.


ACS Applied Materials & Interfaces | 2009

In situ Adhesion Measurements Utilizing Layer-by-Layer Functionalized Surfaces

Adam J. Nolte; Jun Young Chung; Marlon L. Walker; Christopher M. Stafford

The adhesion between poly(dimethylsiloxane) (PDMS) hemispheres coated with layer-by-layer (LbL) assemblies of polyelectrolytes and rigid, planar substrates was investigated using Johnson, Kendall, and Roberts (JKR) contact mechanics. Measurements were performed against amine-functionalized glass slides both in air and in aqueous solutions of controlled pH. Despite the increased density of negatively charged carboxylate groups, LbL-functionalized PDMS exhibited lower adhesion because of the combined effects of increased surface roughness and the high Youngs modulus of the coating. Measurements of coated PDMS in aqueous solutions revealed tunable adhesion behavior dominated by pH-mediated changes in the mechanical properties of the coating. Smoothing the surface of the LbL coatings by aqueous salt annealing led to a significant increase in adhesion. Our results suggest that LbL assembly can be an effective means of surface functionalization for in situ adhesion measurements, but understanding and predicting the adhesion behavior requires comprehensive knowledge of the chemical, mechanical, and topological properties of the coating and how such properties change in response to the ambient environment.


Macromolecules | 2005

Determining the Young's modulus of polyelectrolyte multilayer films via stress-induced mechanical buckling instabilities

Adam J. Nolte; Michael F. Rubner; Robert E. Cohen


Journal of the American Chemical Society | 2006

pH-induced hysteretic gating of track-etched polycarbonate membranes: swelling/deswelling behavior of polyelectrolyte multilayers in confined geometry.

Daeyeon Lee; Adam J. Nolte; Allison L. Kunz; Michael F. Rubner, ,‡ and; Robert E. Cohen


Advanced Materials | 2009

Diffusion‐Controlled, Self‐Organized Growth of Symmetric Wrinkling Patterns

Jun Young Chung; Adam J. Nolte; Christopher M. Stafford


Macromolecules | 2004

pH-Gated Porosity Transitions of Polyelectrolyte Multilayers in Confined Geometries and Their Application as Tunable Bragg Reflectors

Lei Zhai; Adam J. Nolte; Robert E. Cohen; Michael F. Rubner


Macromolecules | 2006

A Two-Plate Buckling Technique for Thin Film Modulus Measurements: Applications to Polyelectrolyte Multilayers

Adam J. Nolte; Robert E. Cohen, ,‡ and; Michael F. Rubner


Macromolecules | 2008

Effect of Relative Humidity on the Young's Modulus of Polyelectrolyte Multilayer Films and Related Nonionic Polymers

Adam J. Nolte; Neil D. Treat; Robert E. Cohen; Michael F. Rubner

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Christopher M. Stafford

National Institute of Standards and Technology

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Jun Young Chung

National Institute of Standards and Technology

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Robert E. Cohen

Massachusetts Institute of Technology

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Michael F. Rubner

Massachusetts Institute of Technology

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Daeyeon Lee

University of Pennsylvania

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Gale A. Holmes

National Institute of Standards and Technology

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John A. Howarter

National Institute of Standards and Technology

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Aaron M. Forster

National Institute of Standards and Technology

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Edwin P. Chan

National Institute of Standards and Technology

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