Adrian P. Nievergelt
École Polytechnique Fédérale de Lausanne
Network
Latest external collaboration on country level. Dive into details by clicking on the dots.
Publication
Featured researches published by Adrian P. Nievergelt.
Nature Nanotechnology | 2016
Jonathan D. Adams; Blake W. Erickson; Jonas Grossenbacher; Jürgen Brugger; Adrian P. Nievergelt; Georg E. Fantner
The success of high-speed atomic force microscopy in imaging molecular motors, enzymes and microbes in liquid environments suggests that the technique could be of significant value in a variety of areas of nanotechnology. However, the majority of atomic force microscopy experiments are performed in air, and the tapping-mode detection speed of current high-speed cantilevers is an order of magnitude lower in air than in liquids. Traditional approaches to increasing the imaging rate of atomic force microscopy have involved reducing the size of the cantilever, but further reductions in size will require a fundamental change in the detection method of the microscope. Here, we show that high-speed imaging in air can instead be achieved by changing the cantilever material. We use cantilevers fabricated from polymers, which can mimic the high damping environment of liquids. With this approach, SU-8 polymer cantilevers are developed that have an imaging-in-air detection bandwidth that is 19 times faster than those of conventional cantilevers of similar size, resonance frequency and spring constant.
Nano Letters | 2015
Pascal D. Odermatt; Arun Shivanandan; Hendrik Deschout; Radek Jankele; Adrian P. Nievergelt; Lely Feletti; Michael W. Davidson; Aleksandra Radenovic; Georg E. Fantner
Nanoscale characterization of living samples has become essential for modern biology. Atomic force microscopy (AFM) creates topological images of fragile biological structures from biomolecules to living cells in aqueous environments. However, correlating nanoscale structure to biological function of specific proteins can be challenging. To this end we have built and characterized a correlated single molecule localization microscope (SMLM)/AFM that allows localizing specific, labeled proteins within high-resolution AFM images in a biologically relevant context. Using direct stochastic optical reconstruction microscopy (dSTORM)/AFM, we directly correlate and quantify the density of localizations with the 3D topography using both imaging modalities along (F-)actin cytoskeletal filaments. In addition, using photo activated light microscopy (PALM)/AFM, we provide correlative images of bacterial cells in aqueous conditions. Moreover, we report the first correlated AFM/PALM imaging of live mammalian cells. The complementary information provided by the two techniques opens a new dimension for structural and functional nanoscale biology.
Review of Scientific Instruments | 2014
Jonathan D. Adams; Adrian P. Nievergelt; Blake W. Erickson; Chen Yang; Maja Dukic; Georg E. Fantner
We present an atomic force microscope (AFM) head for optical beam deflection on small cantilevers. Our AFM head is designed to be small in size, easily integrated into a commercial AFM system, and has a modular architecture facilitating exchange of the optical and electronic assemblies. We present two different designs for both the optical beam deflection and the electronic readout systems, and evaluate their performance. Using small cantilevers with our AFM head on an otherwise unmodified commercial AFM system, we are able to take tapping mode images approximately 5-10 times faster compared to the same AFM system using large cantilevers. By using additional scanner turnaround resonance compensation and a controller designed for high-speed AFM imaging, we show tapping mode imaging of lipid bilayers at line scan rates of 100-500 Hz for scan areas of several micrometers in size.
Scientific Reports | 2015
Adrian P. Nievergelt; Blake W. Erickson; Nahid Hosseini; Jonathan D. Adams; Georg E. Fantner
High—speed atomic force microscopy has proven to be a valuable tool for the study of biomolecular systems at the nanoscale. Expanding its application to larger biological specimens such as membranes or cells has, however, proven difficult, often requiring fundamental changes in the AFM instrument. Here we show a way to utilize conventional AFM instrumentation with minor alterations to perform high-speed AFM imaging with a large scan range. Using a two—actuator design with adapted control systems, a 130 × 130 × 5 μm scanner with nearly 100 kHz open—loop small-signal Z—bandwidth is implemented. This allows for high-speed imaging of biologically relevant samples as well as high-speed measurements of nanomechanical surface properties. We demonstrate the system performance by real-time imaging of the effect of charged polymer nanoparticles on the integrity of lipid membranes at high imaging speeds and peak force tapping measurements at 32 kHz peak force rate.
Beilstein Journal of Nanotechnology | 2014
Adrian P. Nievergelt; Jonathan D. Adams; Pascal D. Odermatt; Georg E. Fantner
Summary Multifrequency atomic force microscopy imaging has been recently demonstrated as a powerful technique for quickly obtaining information about the mechanical properties of a sample. Combining this development with recent gains in imaging speed through small cantilevers holds the promise of a convenient, high-speed method for obtaining nanoscale topography as well as mechanical properties. Nevertheless, instrument bandwidth limitations on cantilever excitation and readout have restricted the ability of multifrequency techniques to fully benefit from small cantilevers. We present an approach for cantilever excitation and deflection readout with a bandwidth of 20 MHz, enabling multifrequency techniques extended beyond 2 MHz for obtaining materials contrast in liquid and air, as well as soft imaging of delicate biological samples.
Nature microbiology | 2017
Haig A. Eskandarian; Pascal D. Odermatt; Joëlle X. Y. Ven; Mélanie T. M. Hannebelle; Adrian P. Nievergelt; Neeraj Dhar; John D. McKinney; Georg E. Fantner
Cell division is tightly controlled in space and time to maintain cell size and ploidy within narrow bounds. In bacteria, the canonical Minicell (Min) and nucleoid occlusion (Noc) systems together ensure that division is restricted to midcell after completion of chromosome segregation1. It is unknown how division site selection is controlled in bacteria that lack homologues of the Min and Noc proteins, including mycobacteria responsible for tuberculosis and other chronic infections2. Here, we use correlated optical and atomic-force microscopy3,4 to demonstrate that morphological landmarks (waveform troughs) on the undulating surface of mycobacterial cells correspond to future sites of cell division. Newborn cells inherit wave troughs from the (grand)mother cell and ultimately divide at the centre-most wave trough, making these morphological features the earliest known landmark of future division sites. In cells lacking the chromosome partitioning (Par) system, missegregation of chromosomes is accompanied by asymmetric cell division at off-centre wave troughs, resulting in the formation of anucleate cells. These results demonstrate that inherited morphological landmarks and chromosome positioning together restrict mycobacterial division to the midcell position.
Nanotechnology | 2016
Nahid Hosseini; Adrian P. Nievergelt; Jonathan D. Adams; V. T. Stavrov; Georg E. Fantner
The accuracy and repeatability of atomic force microscopy (AFM) imaging significantly depend on the accuracy of the piezoactuator. However, nonlinear properties of piezoactuators can distort the image, necessitating sensor-based closed-loop actuators to achieve high accuracy AFM imaging. The advent of high-speed AFM has made the requirements on the position sensors in such a system even more stringent, requiring higher bandwidths and lower sensor mass than traditional sensors can provide. In this paper, we demonstrate a way for high-speed, high-precision closed-loop AFM nanopositioning using a novel, miniaturized micro-electro-mechanical system position sensor in conjunction with a simple PID controller. The sensor was developed to respond to the need for small, lightweight, high-bandwidth, long-range and sub-nm-resolution position measurements in high-speed AFM applications. We demonstrate the use of this sensor for closed-loop operation of conventional as well as high-speed AFM operation to provide distortion-free images. The presented implementation of this closed-loop approach allows for positioning precision down to 2.1 Å, reduces the integral nonlinearity to below 0.2%, and allows for accurate closed loop imaging at line rates up to 300 Hz.
international conference on advanced intelligent mechatronics | 2017
Adrian P. Nievergelt; Santiago H. Andany; Jonathan D. Adams; Mélanie T. M. Hannebelle; Georg E. Fantner
Atomic force microscopy is a uniquely powerful tool for single molecule research. In addition to high-resolution imaging of static systems, recently developed high-speed atomic force microscopes (HS-AFM) enable the observation of dynamic processes at the nanoscale. HS-AFM instrumentation has been developed by systematically increasing the bandwidth of individual components. However, the phase lag and delay of those components, which are of major importance with regard to feedback stability, are often overlooked. Here, we show a high-speed atomic force microscope which takes the delay of components into account and tries to minimize them. The system consists of a small cantilever head with photothermal cantilever drive, a detection bandwidth of above 22MHz and detector noise below 25 fm/Hz0.5. a flexure based high-speed scanner with 1.6µm × 1.6µm lateral scan range together with a novel low phase-lag high voltage amplifier which is controlled by a custom built scan engine. The microscope, built specifically for nanobiology, is designed for robustness and optimized for measurements in liquid. The system achieves over 10 frames per second at 2000 lines per second without active resonance dampening.
Nature Nanotechnology | 2018
Adrian P. Nievergelt; Niccolò Banterle; Santiago H. Andany; Pierre Gönczy; Georg E. Fantner
The self-assembly of protein complexes is at the core of many fundamental biological processes1, ranging from the polymerization of cytoskeletal elements, such as microtubules2, to viral capsid formation and organelle assembly3. To reach a comprehensive understanding of the underlying mechanisms of self-assembly, high spatial and temporal resolutions must be attained. This is complicated by the need to not interfere with the reaction during the measurement. As self-assemblies are often governed by weak interactions, they are especially difficult to monitor with high-speed atomic force microscopy (HS-AFM) due to the non-negligible tip–sample interaction forces involved in current methods. We have developed a HS-AFM technique, photothermal off-resonance tapping (PORT), which is gentle enough to monitor self-assembly reactions driven by weak interactions. We apply PORT to dissect the self-assembly reaction of SAS-6 proteins, which form a nine-fold radially symmetric ring-containing structure that seeds the formation of the centriole organelle. Our analysis reveals the kinetics of SAS-6 ring formation and demonstrates that distinct biogenesis routes can be followed to assemble a nine-fold symmetrical structure.High-speed photothermal off-resonance AFM is developed, capable of monitoring macromolecular self-assembly driven by weak interactions.
Review of Scientific Instruments | 2017
Maja Dukic; Vencislav Todorov; Santiago H. Andany; Adrian P. Nievergelt; Chen Yang; Nahid Hosseini; Georg E. Fantner
Nearly all scanning probe microscopes (SPMs) contain a feedback controller, which is used to move the scanner in the direction of the z-axis in order to maintain a constant setpoint based on the tip-sample interaction. The most frequently used feedback controller in SPMs is the proportional-integral (PI) controller. The bandwidth of the PI controller presents one of the speed limiting factors in high-speed SPMs, where higher bandwidths enable faster scanning speeds and higher imaging resolution. Most SPM systems use digital signal processor-based PI feedback controllers, which require analog-to-digital and digital-to-analog converters. These converters introduce additional feedback delays which limit the achievable imaging speed and resolution. In this paper, we present a digitally controlled analog proportional-integral-derivative (PID) controller. The controller implementation allows tunability of the PID gains over a large amplification and frequency range, while also providing precise control of the system and reproducibility of the gain parameters. By using the analog PID controller, we were able to perform successful atomic force microscopy imaging of a standard silicon calibration grating at line rates up to several kHz.