Akiko Hirai
National Institute of Advanced Industrial Science and Technology
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Publication
Featured researches published by Akiko Hirai.
Optics Letters | 2003
Feng-Lei Hong; Kaoru Minoshima; Atsushi Onae; Hajime Inaba; Hideyuki Takada; Akiko Hirai; Hirokazu Matsumoto; Toshiharu Sugiura; Makoto Yoshida
Frequency comb spanning more than one octave has been achieved by injecting the second harmonic generation (780 nm) of a mode-locked fiber laser (1.56 /spl mu/m) into a photonic crystal fiber. We propose and realize a novel interferometric scheme for observing the carrier-envelope offset frequency.
Optics Letters | 2003
Akiko Hirai; Hirokazu Matsumoto
A new low-coherence interferometric technique is proposed for measuring the group refractive indices of dispersive samples with high accuracy. A tandem configuration of interferometers is used to compensate for the asymmetrical distortion of interferograms that results from the broad spectrum of the light source. The group refractive index can be measured without knowledge of the geometrical thickness of the sample under test. The proposed technique can successfully measure even a thick sample. Computer calculations have shown the effectiveness of the proposed technique, which was verified by preliminary experiments; the difference between the experimental result and the catalog data was 7 x 10(-4).
Optical Engineering | 2001
Akiko Hirai; Hirokazu Matsumoto
A tandem white-light interferometer has been developed, based on the heterodyne technique, for highly accurate and sensitive surface profiling of a three-dimensional (3-D) object. Two acousto-optic modulators (AOMs) and two spherical reflecting mirrors are used in a Michelson interferometer to provide the optical frequency shift for white light. By using this technique in the tandem interferometer, the profiles of mirrorlike and diffusing surfaces of 3-D objects are measured with heterodyne signals of 200 kHz. The optical path difference of the interferometer can be stabilized by simultaneously using coherent and incoherent light. The experimental results show a 27-fold improvement in the stability of the interferometer and the possibility of achieving high accuracy of several tens of nanometers.
Optics Communications | 1999
Hirokazu Matsumoto; Akiko Hirai
Abstract A heterodyne technique for white-light interferometer with a lamp source, which uses two acousto-optic modulators, is developed for high-sensitivity detection of weak light. By using converging input beams input into a Michelson interferometer with spherical mirrors, the spectral dependence of the modulators is canceled, and the white-light heterodyne interference fringes are generated at 200 kHz. Using a tandem interferometer, the object surface which has a low surface reflectivity of less than 10 −4 was detected with a good signal-to-noise ratio.
Applied Optics | 2013
Tetsuya Hashimoto; Akiko Hirai; Kyu Yoshimori
A signal-processing method is proposed in the fully interferometric three-dimensional (3D) imaging spectrometry. This processing computes a 3D interferogram, in which recorded fringe patterns do not directly reflect wavefront forms propagated from a polychromatic light source under measurement. This paper presents a procedure for signal processing including a synthesis of the 3D interferogram and retrieval of a set of spectral components of 3D images. We demonstrate retrieving 3D images for spectral components of two planar light sources by means of the proposed method. The procedure to synthesize the 3D interferogram in this method suggests the possibility of direct measurement of the 3D interferogram.
Applied Optics | 2009
Yasuaki Hori; Akiko Hirai; Kaoru Minoshima; Hirokazu Matsumoto
Interferometer for precise refractive-index measurement of glass-prism without prior knowledge is developed using a direct comparison of optical-path-changes in glass and air. Preliminary result shows uncertainty of 4.4 x 10-5 agreeing with the manufacturerpsilas values.
Applied Optics | 2006
Akiko Hirai; Hirokazu Matsumoto
A technique for the measurement of the group refractive index wavelength dependence of optical materials using a low-coherence tandem interferometer and a spectrometer is proposed. Four channeled spectra resulting from interferences of light beams from different pairs of optical paths are used for the calculation of optical path differences. The group refractive index wavelength dependence is calculated from these optical path differences generated from the sample under measurement. No a priori information of the geometric thickness of a sample is required. The wavelength dependence of the group refractive index of the samples BK7 parallel plate of 5.200 and 10.025 mm from 675 to 850 nm is experimentally measured with an accuracy of the order of 10(-5) and a repeatability of the order of 10(-9).
Optics Communications | 2002
Lijiang Zeng; Ichiro Fujima; Akiko Hirai; Hirokazu Matsumoto; Shigeo Iwasaki
A new two-color heterodyne interferometer using an optical grating was proposed for measuring the refractive index of air. The heterodyne modulation is realized by moving the diffraction grating. The method allows us to measure the refractive index with high accuracy by using a 1:06 lm YAG laser and its second-harmonic wave because two beams (the fundamental and the second-harmonic wave) are in common path completely. Moreover, good signal-to-noise ratio (SNR) can be obtained by the heterodyne interference. Using the refractive index calculated by Edl e equation as a reference, that measured by present method was experimentally evaluated having an accuracy of about 1 � 10 � 6 within a distance of 100 mm. 2002 Elsevier Science B.V. All rights reserved.
Proceedings of SPIE, the International Society for Optical Engineering | 2001
Youichi Bitou; Akiko Hirai; Hideaki Yoshimori; Feng-Lei Hong; Atsushi Onae; Katuo Seta
We have developed a gauge block measurement system that uses three frequency-stabilized lasers. The stabilized lasers are as follows: an I2 stabilized offset locked He-Ne laser, an I2-stabilized Nd:YAG laser, and a Rb-stabilized diode laser. The I2-stabilized offset locked He-Ne laser is commercially available and its relative wavelength uncertainty is 2.5 X 10-11. An I2-stabilized Nd:YAG laser and a Rb-stabilized diode laser was developed in our institute and their relative wavelength uncertainties are 5 X 10-12 and 1 X 10-9, respectively. In the measurement system, laser beams were introduced to the interferometer using an optical multimode fiber. An interferometer fringe pattern was taken using a CCD camera and the excess fraction parts were calculated from the fringe pattern using the Fourier transform method. The excess fraction part obtained from the Rb-stabilized semiconductor laser was used only to determine the integer part of the fringe order, because the accuracy and stability of the wavelength were not sufficient for the long gauge block measurements. This interferometer can measure gauge blocks of up to 1000 nm long and the standard uncertainty of the interferometer is about 75 nm for a 1000 mm long gauge block.
Optics Communications | 1999
Akiko Hirai; Katsuo Seta; Hirokazu Matsumoto
We developed a white-light interferometer that uses pseudo random-modulation for high-sensitivity, high-selectivity measurements of the surface profile of three-dimensional objects. The pseudo random-modulation is achieved by using a multi-segment mirror, where each segment has a different height in a maximum shift-register sequence (M-sequence). Preliminary experiments, where the white-light source was a halogen lamp and the test object was a plane mirror, show that our M-sequence modulated white-light interferometer (MMWI) had a four-time improvement in the signal-to-noise (SNR) ratio compared with that of a conventional interferometer.
Collaboration
Dive into the Akiko Hirai's collaboration.
National Institute of Advanced Industrial Science and Technology
View shared research outputsNational Institute of Advanced Industrial Science and Technology
View shared research outputsCommonwealth Scientific and Industrial Research Organisation
View shared research outputsNational Institute of Advanced Industrial Science and Technology
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